MN54ABT64 Datasheet, PDF (7/9 Pages) National Semiconductor (TI) – MN54ABT646-X REV 0B0

MN54ABT646-X REV 0B0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS(Continued)
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=50pF RL=500 OHMS TRISE/TFALL = 3.0nS
SYMBOL
ts (H/L)
PARAMETER
Setup Time HIGH
or LOW
CONDITIONS
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
NOTES
PIN-
NAME
7 BUS to
Clock
MIN
3.0
MAX
UNIT
SUB-
GROUPS
ns 9
7 BUS to 3.5
Clock
ns 10, 11
th (H/L) Hold Time HIGH or VCC=5.0V @25C, VCC=4.5V & 5.5V
LOW
@-55C/125C
7 BUS to 1.0
Clock
ns 9
7 BUS to 1.0
Clock
ns 10, 11
tw (L)
Pulse Width
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
7 CPAB/CP 4.0
BA
ns 9, 10,
11
Fmax
Max Clock
Frequency
VCC=5.0V @25C, VCC=4.5V & 5.5V
@-55C/125C
7 CPAB/CP
BA
125
MHz 9, 10,
11
Note 1: Screen tested 100% on each device at -55C, +25C & +125C Temp., Subgroups 1,2,3,7 & 8.
Note 2: Screen tested 100% on each device at -55C, +25C, and +125C temp., subgroups A9, A10,
and A11.
Note 3: Screen tested 100% on each device at +25C temp. only, subgroup A9.
Note 4: Sample tested (Method 5005, Table 1) on each mfg. lot at +25C, +125C, & -55C temp.
subgroups A1, 2, 3, 7 & 8.
Note 5: Sample tested (Method 5005, Table 1) on each mfg. Lot at +25C, +125C & -55C temp.,
subgroups A9, 10 & 11.
Note 6: Sample tested (Method 5005, Table 1) on each mfg. Lot at 25C temp only, subgroup A9.
Note 7: Not tested (Guaranteed by Design Characterization Data).
Note 8: Max number of outputs defines as (N). N-1 data inputs are driven 0V to 3V. one
output @Vol or @Voh.
Note 9: Max number of data inputs (N) switching. (N-1) inputs switching 0V to 3V.
Input-under-test switching : 3V to threshold (Vild), 0V to threshold (Vihd), Freq= 1
MHZ
Note 10: Maximum test duration not to exceed one second, not more than one output shorted at
one time.
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