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DS90LV001 Datasheet, PDF (7/13 Pages) National Semiconductor (TI) – 3.3V LVDS-LVDS Buffer
Application Information
Mode of Operation:
The DS90LV001 can be used as a ’stub-hider.’ In many
systems, signals are distributed across backplanes, and one
of the limiting factors for system speed is the ’stub length’ or
the distance between the transmission line and the untermi-
nated receivers on the individual cards. Although it is gener-
ally recognized that this distance should be as short as
possible to maximize system performance, real-world pack-
aging concerns and PCB designs often make it difficult to
make the stubs as short as the designer would like. The
DS90LV001, available in the LLP (Leadless Leadframe
Package) package, can improve system performance by
allowing the receiver to be placed very close to the main
transmission line either on the backplane itself or very close
to the connector on the card. Longer traces to the LVDS
receiver may be placed after the DS90LV001. This very
small LLP package is a 75% space savings over the SOIC
package.
Input failsafe:
The receiver inputs of the DS90LV001 do not have internal
failsafe biasing. For point-to-point and multidrop applications
with a single source, failsafe biasing may not be required.
When the driver is off, the link is in-active. If failsafe biasing
is required, this can be accomplished with external high
value resistors. Using the equations in the LVDS Owner’s
Manual Chapter 4, the IN+ should be pull to VCC (3.3V) with
20kΩ and the IN− should be pull to GND with 12kΩ. This
provides a slight positive differential bias, and sets a known
HIGH state on the link with a minimum amount of distortion.
PCB Layout and Power System Bypass:
Circuit board layout and stack-up for the DS90LV001 should
be designed to provide noise-free power to the device. Good
layout practice also will separate high frequency or high level
inputs and outputs to minimize unwanted stray noise pickup,
feedback and interference. Power system performance may
be greatly improved by using thin dielectrics (4 to 10 mils) for
power/ground sandwiches. This increases the intrinsic ca-
pacitance of the PCB power system which improves power
supply filtering, especially at high frequencies, and makes
the value and placement of external bypass capacitors less
critical. External bypass capacitors should include both RF
ceramic and tantalum electrolytic types. RF capacitors may
use values in the range 0.01 µF to 0.1 µF. Tantalum capaci-
tors may be in the range 2.2 µF to 10 µF. Voltage rating for
tantalum capacitors should be at least 5X the power supply
voltage being used. It is recommended practice to use two
vias at each power pin of the DS90LV001 as well as all RF
bypass capacitor terminals. Dual vias reduce the intercon-
nect inductance by up to half, thereby reducing interconnect
inductance and extending the effective frequency range of
the bypass components.
DS101338-15
The outer layers of the PCB may be flooded with additional
ground plane. These planes will improve shielding and iso-
lation as well as increase the intrinsic capacitance of the
power supply plane system. Naturally, to be effective, these
planes must be tied to the ground supply plane at frequent
intervals with vias. Frequent via placement also improves
signal integrity on signal transmission lines by providing
short paths for image currents which reduces signal distor-
tion. The planes should be pulled back from all transmission
lines and component mounting pads a distance equal to the
width of the widest transmission line or the thickness of the
dielectric separating the transmission line from the internal
power or ground plane(s) whichever is greater. Doing so
minimizes effects on transmission line impedances and re-
duces unwanted parasitic capacitances at component
mounting pads.
There are more common practices which should be followed
when designing PCBs for LVDS signaling. Please see appli-
cation note AN-1108 for guidelines. In addition, application
note AN-1187 has additional information specifically related
to LLP recommendations.
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