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ADC12451 Datasheet, PDF (7/18 Pages) National Semiconductor (TI) – Dynamically-Tested Self-Calibrating 12-Bit Plus Sign A/D Converter with Sample-and-Hold
Electrical Characteristics (Continued)
TL H 11025 – 7
FIGURE 1b Simplified Error Curve vs Output Code without Auto-Cal or Auto-Zero Cycles
FIGURE 1c Simplified Error Curve vs Output Code after Auto-Cal Cycle
TL H 11025 – 8
Typical Performance Characteristics
Zero Error Change vs
Ambient Temperature
Zero Error vs VREF
Linearity Error vs VREF
TL H 11025 – 9
7