MV54ACTQ541-X Datasheet, PDF (6/7 Pages) National Semiconductor (TI) – Octal Buffer/Line Driver with TRI-STATE Outputs

MV54ACTQ541-X REV 0A0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC: CL=50pf, RL=500 OHMS, TR & TF=3.0ns, Temp range: -55C to +125C.
SYMBOL
tpLH
PARAMETER
Propagation Delay VCC=4.5V
CONDITIONS
NOTES
PIN-
NAME
3, Dn to
4, 7 On
MIN
2.0
MAX
8.0
UNIT
ns
SUB-
GROUPS
9
3, Dn to 2.0
9.0
ns 10, 11
4, 7 On
tpHL
Propagation Delay VCC=4.5V
3, Dn to 2.0
8.0
ns 9
4, 7 On
3, Dn to 2.0
9.0
ns 10, 11
4, 7 On
tpZH
Output Enable
Time
VCC=4.5V
3, OE to 1.5
8.0
ns 9
4, 7 On
3, OE to 1.5
9.5
ns 10, 11
4, 7 On
tpZL
Output Enable
Time
VCC=4.5V
3, OE to 1.5
4, 7 On
10.0 ns 9
3, OE to 1.5
4, 7 On
11.5 ns 10, 11
tpHZ
Output Disable
Time
VCC=4.5V
3, OE to 1.5
8.0
ns 9
4, 7 On
3, OE to 1.5
9.5
ns 10, 11
4, 7 On
tpLZ
Output Disable
Time
VCC=4.5V
3, OE to 1.5
8.0
ns 9
4, 7 On
3, OE to 1.5
9.5
ns 10, 11
4, 7 On
Note 1:
Note 2:
Note 3:
Note 4:
Note 5:
SCREEN TESTED 100% ON EACH DEVICE AT +25C & +125C TEMPERATURE, SUBGROUPS 1, 2, 7, &
8.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C & -55C
TEMPERATURE, SUBGROUPS A1, 2, 3, 7, & 8.
SCREEN TESTED 100% ON EACH DEVICE AT +25C TEMPERATURE ONLY SUBGROUP A9.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C, +125C, -55C
TEMPERATURE, SUBGROUPS A9, 10 & 11.
TRANSMISSION LINE DRIVING TEST, GUARDBANDED LIMITS SET FOR +25C, 2 MSEC DURATION MAX.
Note 6:
Note 7:
Note 8:
Note 9:
GUARANTEED BUT NOT TESTED. (DESIGN CHARACTERIZATION DATA)
MIN LIMITS GUARANTEED FOR 5.5V BY GUARDBANDING 4.5V MINIMUM LIMITS.
MAX NUMBER OF OUTPUTS DEFINED AS (N). DATA INPUTS ARE DRIVEN 0V TO 3V. ONE OUTPUT @
VOL.
MAX NUMBER OF DATA INPUTS (N) SWITCHING. (N-1) INPUTS SWITCHING 0V TO 3V.
INPUT-UNDER-TEST SWITCHING 3V TO THRESHOLD (VILD), 0V TO THRESHOLD (VIHD), FREQ= 1
MHZ.
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