DS75451 Datasheet, PDF (6/14 Pages) National Semiconductor (TI) – Series Dual Peripheral Drivers

DC Test Circuits (Continued)
DS005824-21
Circuit
DS75451
DS75452
DS75453
Input
Under
Test
V_IH
V_IL
V_IH
V_IL
V_IH
V_IL
Other
Input
V_IH
V_CC
V_IH
V_CC
Gnd
V_IL
Output
Apply
V_OH
I_OL
I_OL
V_OH
V_OH
I_OL
Measure
I_OL
V_OL
V_OL
I_OH
I_OH
V_OH
FIGURE 7. V_IH, V_IL, I_OH, V_OL
DS005824-22
Note A: Each input is tested separately.
Note B: When testing DS75453 input not under test is grounded.
For all other circuits it is at 4.5V.
FIGURE 8. V_I, V_IL
DS005824-24
Both gates are tested simultaneously.
FIGURE 10. I_CCH, I_CCL for AND, NAND Circuits
Each input is tested separately.
FIGURE 9. I_I, I_IH
DS005824-23
DS005824-25
Both gates are tested simultaneously.
FIGURE 11. I_CCH, I_CCL for OR, NOR Circuits
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