DS75451 Datasheet, PDF (5/14 Pages) National Semiconductor (TI) – Series Dual Peripheral Drivers

DC Test Circuits
Both inputs is tested simultaneously.
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FIGURE 1. V_IH, V_OL
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Each input is tested separately.
FIGURE 2. V_IL, V_OH
Each input is tested separately.
FIGURE 3. V_I, I_IL
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Each input is tested separately.
FIGURE 4. I_I, I_IH
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Each input is tested separately.
FIGURE 5. I_OS
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Both gates are tested simultaneously.
FIGURE 6. I_CCH, I_CCL
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