THS4524-EP Datasheet, PDF (3/48 Pages) Texas Instruments – VERY LOW POWER, NEGATIVE RAIL INPUT, RAIL-TO-RAIL OUTPUT, FULLY DIFFERENTIAL AMPLIFIER

www.ti.com
THS4524-EP
SBOS609A – JUNE 2012 – REVISED AUGUST 2013
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
T_A
PACKAGE-LEAD
-55°C to 125°C
TSSOP - 38
PACKAGE/ORDERING INFORMATION⁽¹⁾
PACKAGE DESIGNATOR
ORDERABLE PART
NUMBER
TOP-SIDE MARKING
DBT
Tape and reel,
2000
Rails, 50
THS4524MDBTREP
THS4524MDBTEP
THS4524EP
THS4524EP
VID NUMBER
V62/12612-01XE
V62/12612-01XE-T
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or visit the
device product folder at www.ti.com.
ABSOLUTE MAXIMUM RATINGS⁽¹⁾
Over operating free-air temperature range (unless otherwise noted).
Supply Voltage, V_S– to V_S+
Input/Output Voltage, V_I (V_IN±, V_OUT±, V_OCM pins)
Differential Input Voltage, V_ID
Output Current, I_O
Input Current, I_I (V_IN±, V_OCM pins)
Continuous Power Dissipation
Maximum Junction Temperature, T_J
Maximum Junction Temperature, T_J (continuous operation, long-term reliability)
Operating Free-air Temperature Range, T_A
Storage Temperature Range, T_STG
ESD
Rating:
Human Body Model (HBM)
Charge Device Model (CDM)
Machine Model (MM)
THS4524
UNIT
5.5
V
(V_S–) – 0.7 to (V_S+) + 0.7V
V
1
V
100
mA
10
mA
See Thermal Characteristic Specifications
+150
°C
+125
°C
–55 to 125
°C
–65 to +150
°C
1300
V
1000
V
50
V
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated is not implied. Exposure to absolute-
maximum-rated conditions for extended periods may affect device reliability.
Copyright © 2012–2013, Texas Instruments Incorporated
Product Folder Links :THS4524-EP
Submit Documentation Feedback
3