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| JM54AC10BDA Datasheet, PDF (3/8 Pages) National Semiconductor (TI) – Triple 3-Input NAND Gate | |||
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DC Characteristics for âAC Family Devices (Continued)
74AC
54AC
74AC
Symbol
Parameter
VCC
(V)
TA a25 C
TA
TA
Units
b55 C to a125 C b40 C to a85 C
Conditions
Typ
Guaranteed Limits
IOLD
IOHD
ICC
Minimum Dynamic 5 5
Output Current
55
Maximum Quiescent 5 5
Supply Current
50
b50
20
40 0
75
b75
20 0
mA VOLD 1 65V Max
mA VOHD 3 85V Min
mA VIN VCC
or GND
Maximum test duration 2 0 ms one output loaded at a time
Note IIN and ICC 3 0V are guaranteed to be less than or equal to the respective limit
ICC for 54AC 25 C is identical to 74AC 25 C
5 5V VCC
DC Characteristics for âACT Family Devices
Symbol
Parameter
VCC
(V)
VIH
Minimum High Level
45
Input Voltage
55
VIL
Maximum Low Level
45
Input Voltage
55
VOH
Minimum High Level
45
Output Voltage
55
74ACT
74ACT
TA a25 C
TA
b40 C to a85 C
Typ
Guaranteed Limits
15
20
20
15
20
20
15
08
08
15
08
08
4 49
44
44
5 49
54
54
45
3 86
3 76
55
4 86
4 76
VOL
Maximum Low Level
45
0 001
01
01
Output Voltage
55
0 001
01
01
45
55
IIN
Maximum Input
55
Leakage Current
ICCT
IOLD
IOHD
ICC
Maximum
ICC Input
55
06
Minimum Dynamic
55
Output Current
55
Maximum Quiescent
Supply Current
55
All outputs loaded thresholds on input associated with output under test
Maximum test duration 2 0 ms one output loaded at a time
0 36
0 36
g0 1
40
0 44
0 44
g1 0
15
75
b75
40 0
Units
V
V
V
V
V
V
mA
mA
mA
mA
mA
Conditions
VOUT 0 1V
or VCC b 0 1V
VOUT 0 1V
or VCC b 0 1V
IOUT b50 mA
VIN
IOH
IOUT
VIL or VIH
b24 mA
b24 mA
50 mA
VIN
IOL
VIL or VIH
24 mA
24 mA
VI VCC GND
VI VCC b 2 1V
VOLD 1 65V Max
VOHD 3 85V Min
VIN VCC
or GND
3
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