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SCAN926260 Datasheet, PDF (1/18 Pages) National Semiconductor (TI) – Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and At-Speed BIST
July 2004
SCAN926260
Six 1 to 10 Bus LVDS Deserializers with IEEE 1149.1 and
At-Speed BIST
General Description
The SCAN926260 integrates six 10-bit deserializer devices
into a single chip. The SCAN926260 can simultaneously
deserialize up to six data streams that have been serialized
by National Semiconductor’s 10-bit Bus LVDS serializers. In
addition, the SCAN926260 is compliant with IEEE standard
1149.1 and also features an At-Speed Built-In Self Test
(BIST). For more details, please see the sections titled "IEEE
1149.1 Test Modes" and "BIST Alone Test Modes."
Each deserializer block in the SCAN926260 has it’s own
powerdown pin (PWRDWN[n])and operates independently
with its own clock recovery circuitry and lock-detect signal-
ing. In addition, a master powerdown pin (MS_PWRDWN)
which puts all the entire device into sleep mode is provided.
The SCAN926260 uses a single +3.3V power supply and
consumes 1.2W at 3.3V with a PRBS-15 pattern on all
channels at 660Mbps.
Features
n Deserializes one to six Bus LVDS input serial data
streams with embedded clocks
n IEEE 1149.1 (JTAG) Compliant and At-Speed BIST test
modes
n Parallel clock rate 16-66MHz
n On chip filtering for PLL
n High impedance inputs upon power off (Vcc = 0V)
n Single power supply at +3.3V
n 196-pin LBGA package (Low-profile Ball Grid Array)
package
n Industrial temperature range operation: −40˚C to +85˚C
n ROUTn[0:9] and RCLKn default high when channel is
not locked
n Powerdown per channel to conserve power on unused
channels
Typical Application
20028302
Ordering Information
Order Number
SCAN926260TUF
SCAN926260TUFX
Function
Package
Six Channel 10-bit BLVDS Deserializer UJB196A (Trays)
with IEEE 1149.1 and At-Speed BIST
Six Channel 10-bit BLVDS Deserializer UJB196A (Tape and Reel)
with IEEE 1149.1 and At-Speed BIST
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© 2004 National Semiconductor Corporation DS200283
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