SVHB21V105M Datasheet, PDF (14/20 Pages) NEC – SURFACE MOUNT RESIN MOLDED TANTALUM CHIP CAPACITORS HIGH RELIABILITY

SV/H SERIES
GUIDE TO APPLICATIONS FOR TANTALUM CHIP CAPACITORS
The failure of the solid tantalum capacitor is mostly classified into a short-circuiting mode and a large leakage
current mode. Refer to the following for reliable circuit design.
1. Field failure rate
SV/H Series tantalum chip capacitors are typically applied to decoupling, blocking, by-passing and filtering.
The SV/H Series has a very low failure rate in the field. For example, the maximum field failure rate of an SV/H
Series capacitor with a DC working voltage of 16 V is 0.0002 %/1000 hour (2 Fit) at an applied voltage of 5 V, operating
temperature of 25°C and series resistance of 3 Ω.
The maximum failure rate in the field is estimated by following expression:
λ
=
λ0

V
V0

3
×
2^{}
T−T0
10

λ : Maximum field failure rate
λ0 : 0.5%/1000 hour (The failure rate of the SV/H Series at the full rated DC working voltage at operating
temperature of 85°C and series resistance of 3 Ω.)
V : Applied voltage in actual use
V0 : Rated DC working voltage
T : Operating temperature in actual use
T0 : 85°C
120
110
100
90
80
70
60
50
40
30
20
14
The nomograph is provided for quick estima-
10²
tion of maximum field failure rates.
7
4
2
Connect operating temperature T and ap-
10¹
plied voltage ratio V/V0 of interest with a
7
4
straight line. The failure rate multiplier F is
2
1.0
given at the intersection of this line with the
10⁰
0.9
model scale. The failure rate is obtained as
7
4
0.8
λ = λ0·F.
0.7
2
10^–1
0.6
Examples:
7
0.5
Given V/V0 = 0.4 and T = 45°C, read
4
2
0.4
F = 4 × 10^–3.
10^–2
Hence, λ = 0.002%/1000 hour (20 Fit).
7
4
2
0.3
Given V/V0 = 0.3 and T = 25°C, read
F = 4 × 10^–4.
10^–3
Hence, λ = 0.0002%/1000 hour (2 Fit).
7
0.2
4
2
10^–4
7
4
2
0.1
10^–5