GRM2195C1H472JA01D Datasheet, PDF (9/13 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors

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C02E10.pdf 04.1.20
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GRM Series Specifications and Test Methods
Specifications
No.
Item
Temperature
Compensating Type
High Dielectric Type
Test Method
1
Operating
Temperature
Y55 to W125D
4
2 Rated Voltage
See the previous page.
R6 : Y55 to W85D
R7 : Y55 to W125D
E4 : W10 to W85D
F5 : Y30 to W85D
3 Appearance
No defects or abnormalities
The rated voltage is defined as the maximum voltage which
may be applied continuously to the capacitor.
When AC voltage is superimposed on DC voltage, V^P-P or V^O-P,
whichever is larger, should be maintained within the rated
voltage range.
Visual inspection
4 Dimensions
Within the specified dimensions
Using calipers on micrometer
5 Dielectric Strength No defects or abnormalities
No failure should be observed when ^*300% of the rated voltage
(C0∆ to U2J and SL) or ^*250% of the rated voltage (X5R, X7R,
Z5U and Y5V) is applied between the terminations for 1 to 5
seconds, provided the charge/discharge current is less than
50mA. ^*200% for 500V
6
Insulation
Resistance
More than 10,000MΩ or 500Ω • F (Whichever is smaller)
The insulation resistance should be measured with a DC
voltage not exceeding the rated voltage at 25D and 75%RH
max. and within 2 minutes of charging.
7 Capacitance
Within the specified tolerance
Q/
30pFmin. : Q U1000
8 Dissipation Factor 30pFmax. : Q U400+20C
(D.F.)
C : Nominal Capacitance (pF)
[R6, R7]
W.V. : 25Vmin. : 0.025max.
W.V. : 16/10V : 0.035max.
W.V. : 6.3V
0.05max.(CF3.3µF)
0.1max.(CU3.3µF)
[E4]
W.V. : 25Vmin. : 0.025max.
[F5]
W.V. : 25Vmin.
: 0.05max.(CF0.10µF)
: 0.09max.(CU0.10µF)
W.V. : 16V/10V : 0.125max.
W.V. : 6.3Vmax. : 0.15max.
The capacitance/Q/D.F. should be measured at 25D at the
frequency and voltage shown in the table.
Item
Char.
∆C to 7U, 1X
(1000pF and
below)
∆C to 7U, 1X
(more than
1000pF)
Frequency
1T0.1MHz
1T0.1kHz
Voltage
0.5 to 5Vrms
1T0.2Vrms
R6, R7, F5
(10µF and below)
1T0.1kHz
1T0.2Vrms
R6, R7, F5
(more than 10µF)
E4
120T24Hz
1T0.1kHz
0.5T0.1Vrms
0.5T0.05Vrms
Capacitance Within the specified tolerance
Change
(Table A)
R6 : WithinT15%
(Y55 to W85D)
R7 : Within±15%
(Y55 to W125D)
E4 : Within W22/Y56%
(W10 to W85D)
F5 : Within W22/Y82%
(Y30 to W85D)
9
Capacitance
Temperature
Characteristics
Temperature
Coefficient
Within the specified tolerance
(Table A)
Capacitance
Within T0.2% or T0.05pF
(Whichever is larger.)
Drift
*Does not apply to 1X/25V
The capacitance change should be measured after 5 min. at
each specified temperature stage.
(1) Temperature Compensating Type
The temperature coefficient is determined using the
Capacitance measured in step 3 as a reference.
When cycling the temperature sequentially from step 1 through
5 (C0∆ : W25D to W125D : other temp. coeffs. : W25D to
W85D) the capacitance should be within the specified tolerance
for the temperature coefficient and capacitance change as
Table A.
The capacitance drift is calculated by dividing the differences
between the maximum and minimum measured values in steps
1, 3 and 5 by the capacitance value in step 3.
Step
1
2
3
Temperature(D)
25T2
Y55T3 (for ∆C to 7U/1X/R6/R7)
Y30T3 (for F5)
10T3 (for E4)
25T2
4
125T3 (for ∆C/R7)
85T3 (for other TC)
5
25T2
(2) High Dielectric Constant Type
The ranges of capacitance change compared with the above
25D value over the temperature ranges shown in the table
should be within the specified ranges.
Continued on the following page.
22