GRM2195C1H472JA01D Datasheet, PDF (12/13 Pages) Murata Manufacturing Co., Ltd. – Chip Monolithic Ceramic Capacitors

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GRM Series Specifications and Test Methods
Continued from the preceding page.
Specifications
No.
Item
Temperature
Compensating Type
High Dielectric Type
Test Method
The measured and observed characteristics should satisfy the
specifications in the following table.
Appearance No marking defects
Capacitance Within T5% or T0.5pF
R6, R7 : Within T12.5%
4
Change
(Whichever is larger)
E4, F5 : Within T30%
Humidity
16 Steady
State
Q/D.F.
I.R.
Dielectric
Strength
30pF and over : QU350
10pF and over
30pF and below :
QU275W5C/2
10pF and below :
QU200W10C
C : Nominal Capacitance (pF)
[R6, R7]
W.V. : 25Vmin. : 0.05max.
W.V. : 16/10V : 0.05max.
W.V. : 6.3V
0.075max. (CF3.3µF)
0.125max. (CU3.3µF)
[E4]
W.V. : 25Vmin. : 0.05max.
[F5]
W.V. : 25Vmin.
: 0.075max. (CF0.10µF)
: 0.125max. (CU0.10µF)
W.V. : 16V/10V : 0.15max.
W.V. : 6.3Vmax. : 0.2max.
More than 1,000MΩ or 50Ω • F (Whichever is smaller)
No failure
Let the capacitor sit at 40T2D and 90 to 95% humidity for
500T12 hours.
Remove and let sit for 24T2 hours (temperature compensating
type) or 48T4 hours (high dielectric constant type) at room tem-
perature, then measure.
The measured and observed characteristics should satisfy the
specifications in the following table.
Humidity
17
Load
Appearance
Capacitance
Change
Q/D.F.
I.R.
No marking defects
Within T7.5% or T0.75pF
(Whichever is larger)
30pF and over : QU200
30pF and below :
QU100+10C/3
C : Nominal Capacitance (pF)
R6, R7 : Within T12.5%
E4 : Within T30%
F5 : Within T30%
[W.V. : 10Vmax.]
F5 : Within W30/Y40%
[R6, R7]
W.V. : 25Vmin. : 0.05max.
W.V. : 16/10V : 0.05max.
W.V. : 6.3V
0.075max. (CF3.3µF)
0.125max. (CU3.3µF)
[E4]
W.V. : 25Vmin. : 0.05max.
[F5]
W.V. : 25Vmin.
: 0.075max. (CF0.10µF)
: 0.125max. (CU0.10µF)
W.V. : 16V/10V : 0.15max.
W.V. : 6.3Vmax. : 0.2max.
Apply the rated voltage at 40T2D and 90 to 95% humidity for
500T12 hours. Remove and let sit for 24T2 hours (temperature
compensating type) or 48T4 hours (high dielectric constant
type) at room temperature, then measure. The charge/discharge
current is less than 50mA.
#Initial measurement for F5/10V max.
Apply the rated DC voltage for 1 hour at 40T2D.
Remove and let sit for 48T4 hours at room temperature.
Perform initial measurement.
More than 500MΩ or 25Ω • F (Whichever is smaller)
Dielectric
Strength ^{No failure}
Continued on the following page.
25