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MUV_12 Datasheet, PDF (1/2 Pages) MMD Components – MUV Series 5X3.2 Ceramic SMD Oscillator
MUV Series 5X3.2 Ceramic SMD Oscillator
 5 x 3.2 SMD Package 6 Pin
 LVDS Output
 Tristate Option
 Tape & Reel Packaging Available
Frequency Range
Temperature Stability (Inclusive of Temperature, Load, Voltage, and Aging)
Operating Temperature Range
Storage Temperature Range
Supply Voltage (Vdd) ±5%
Supply Current
Output
Logic “1”
Logic “0”
Differential Output Voltage
Offset Voltage
Differential Output Error
Offset Error
Output Swing
Symmetry (50% of waveform)
Load
Rise/Fall Time (20% to 80%)
RMS Phase Jitter (12kHZ to 20MHZ)
Phase Noise
10 Hz
1 KHz
10 KHz
100 KHz
Start-up Time
Tri-state Operation
Standby Current
74.250MHZ to 166.00MHZ
(See Part Number Guide for Options)
(See Part Number Guide for Options)
-55°C to +125°C
+2.50 VDC
+3.30 VDC
63mA max
65mA max
LVDS
+1.43 VDC typ, +1.60 VDC max
+1.10 VDC typ, +0.90 VDC min
+330mV, +454mV max
+1.250 V, +1.375V max
50 mV max
150 mV max
250 mV min
(See Part Number Guide for Options)
100Ω Between Output and Complementary Output
300pSec, 700pSec max
1pSec max
-95dBc/Hz
-125dBc/Hz
-143dBc/Hz
-146dBc/Hz
10mSec max
Voh = 70% of Vdd min or No Connection to Enable Output
Vol = 30% max or grounded to Disable Output (High Impedance)
30µA max
Mechanical & Environmental Detail
Marking Detail
Shock
Solderability
Solvent Resistance
Vibration
Gross Leak Test
Fine Leak Test
MSL
MIL-STD-883, Method 2002 Cond B
MIL-STD-883, Method 2003
MIL-STD-202, Method 215
MIL-STD-883, Method 2007, Cond A
MIL-STD-883, Method 1014, Cond C
MIL-STD-883, Method 1014, Cond A2
Level 1 per IPC/JEDEC J-STD 20
Line 1 = MXXXXX
M = MMD
XXXXX = Frequency in MHZ
Line 2 = SYYWWL
S = Internal Code
YYWW
=
4 Digit Date Code (Year /
Week)
L = Denotes RoHS Compliant
Line 3 = XXXXX
Internal use only
May vary with lots
Black dot to denote Pin 1
MMD Monitor/Quartztek
30400 Esperanza, Rancho Santa Margarita, CA, 92688
Phone: (949) 709-5075, Fax: (949) 709-3536, www.mmdcomp.com
Sales@mmdcomp.com
Subject to change without notice
Revision:
03/01/11 C
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