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A3PE600-2PQ208 Datasheet, PDF (96/162 Pages) Microsemi Corporation – ProASIC3E Flash Family FPGAs with Optional Soft ARM Support
ProASIC3E DC and Switching Characteristics
Embedded FlashROM Characteristics
CLK
tSU
tHOLD
tSU
tHOLD
tSU
tHOLD
Address
Data
A0
tCKQ2
D0
A1
tCKQ2
D0
tCKQ2
D1
Figure 2-54 • Timing Diagram
Timing Characteristics
Table 2-102 • Embedded FlashROM Access Time
Parameter
Description
tSU
tHOLD
tCK2Q
FMAX
Address Setup Time
Address Hold Time
Clock to Out
Maximum Clock Frequency
–2
0.53
0.00
16.23
15
–1
0.61
0.00
18.48
15
Std.
0.71
0.00
21.73
15
Units
ns
ns
ns
MHz
JTAG 1532 Characteristics
JTAG timing delays do not include JTAG I/Os. To obtain complete JTAG timing, add I/O buffer delays to
the corresponding standard selected; refer to the I/O timing characteristics in the "User I/O
Characteristics" section on page 2-12 for more details.
Timing Characteristics
Table 2-103 • JTAG 1532
Commercial-Case Conditions: TJ = 70°C, VCC = 1.425 V
Parameter
Description
–2 –1 Std.
Units
tDISU
Test Data Input Setup Time
0.50 0.57 0.67
ns
tDIHD
Test Data Input Hold Time
1.00 1.13 1.33
ns
tTMSSU
Test Mode Select Setup Time
0.50 0.57 0.67
ns
tTMDHD
Test Mode Select Hold Time
1.00 1.13 1.33
ns
tTCK2Q
Clock to Q (data out)
6.00 6.80 8.00
ns
tRSTB2Q
Reset to Q (data out)
20.00 22.67 26.67
ns
FTCKMAX
TCK Maximum Frequency
25.00 22.00 19.00
MHz
tTRSTREM
ResetB Removal Time
0.00 0.00 0.00
ns
tTRSTREC
ResetB Recovery Time
0.20 0.23 0.27
ns
tTRSTMPW
ResetB Minimum Pulse
TBD TBD TBD
ns
Note: For specific junction temperature and voltage supply levels, refer to Table 2-6 on page 2-5 for derating values.
2-82
Revision 13