PL610-02 Datasheet, PDF (9/16 Pages) Microchip Technology – 1.8V to 3.3V Single IC XO with Frequency Tuning (10 MHz to 130 MHz)

3.0 MEASUREMENT TEST
CIRCUITS (MTC)
A
0.1μF
VDD
XIN
CLK
XOUT
OE^ GND
FET
Probe
CL
FIGURE 3-1:
MTC-1: Rise Time, Fall
Time, Duty Cycle, V_OL, V_OH, I_DD, Power Down
Current, Output Enable/Disable.
0.1μF
VDD
XIN
CLK
XOUT
OE^ GND
FET
Probe
0.1μF ^V
FIGURE 3-2:
MTC-2: Output Drive
Current and Output Impedance.
PL610-01/-02/-03
0.1μF
VDD
XIN
CLK
XOUT
OE^ GND
R ^0.1μF
FIGURE 3-3:
Noise.
MTC-3: Jitter and Phase
Network
Analyzer
VDD
XIN
CLK
XOUT
OE^ GND
0.1μF
FIGURE 3-4:
Resistance.
MTC-4: Negative
 2016 Microchip Technology Inc.
DS20005616A-page 9