MCP4728 Datasheet, PDF (6/66 Pages) Microchip Technology – 12-Bit, Quad Digital-to-Analog Converter with EEPROM Memory

MCP4728
ELECTRICAL CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise indicated, all parameters apply at V_DD = + 2.7V to 5.5V, V_SS = 0V,
R_L = 5 kΩ, C_L = 100 pF, G_X = 1, T_A = -40°C to +125°C. Typical values are at +25°C, V_IH = V_DD, V_IL = V_SS.
Parameter
Symbol Min Typical Max Units
Conditions
DAC-to-DAC Crosstalk
Digital Interface
Output Low Voltage
Schmitt Trigger
Low Input
Threshold Voltage
Schmitt Trigger
High Input
Threshold Voltage
Input Leakage
Pin Capacitance
EEPROM
EEPROM Write Time
Data Retention
—
<10
—
nV-s
V_OL
—
—
0.4
V I_OL = 3 mA
SDA and RDY/BSY pins
V_IL
—
—
0.3V_DD
V V_DD > 2.7V.
SDA, SCL, LDAC pins
—
—
0.2V_DD
V V_DD ≤ 2.7V.
SDA, SCL, LDAC pins
V_IH
0.7V_DD
—
—
V SDA, SCL, LDAC pins
I_LI
—
—
±1
µA SCL = SDA = LDAC = V_DD,
SCL = SDA = LDAC = V_SS
C_PIN
—
—
3
pF (Note 4)
TWRITE
—
25
50
ms EEPROM write time
—
200
—
Years At +25°C, (Note 3)
LDAC Input
LDAC Low Time
T_LDAC
210
—
—
ns Updates analog outputs (Note 3)
Note 1: All digital input pins (SDA, SCL, LDAC) are tied to “High”, Output pins are unloaded, code = 0x000.
2: The power-up ramp rate measures the rise of V_DD over time.
3: This parameter is ensured by design and not 100% tested.
4: This parameter is ensured by characterization and not 100% tested.
5: Test code range: 100 - 4000 codes, V_REF = V_DD, V_DD = 5.5V.
6: Time delay to settle to a new reference when switching from external to internal reference or vice versa.
7: This parameter is indirectly tested by Offset and Gain error testing.
8: Within 1/2 LSB of the final value when code changes from 1/4 of to 3/4 of full scale.
9: This time delay is measured from the falling edge of ACK pulse in I²C command to the beginning of V_OUT.
This time delay is not included in the output settling time specification.
DS22187C-page 6
© 2009 Microchip Technology Inc.