MIC5010 Datasheet, PDF (3/16 Pages) Micrel Semiconductor – Full-Featured High- or Low-Side MOSFET Driver

MIC5010
Micrel
Electrical Characteristics (Note 3) Test circuit. T_A = –55°C to +125°C, V⁺ = 15V, V₁ = 0 V, I₄ = I₅ = I₁₄ = 0, all
switches open, unless otherwise specified.
Parameter
Conditions
Min Typical Max Units
Supply Current, I₁₃
Logic Input Voltage, V_IN
Logic Input Current, I₃
Input Capacitance
V⁺ = 32V
V⁺ = 4.75V
V⁺ = 15V
V+ = 32V
Pin 3
V_IN = 0V, S4 closed
V_IN = V_S = 32V, I₄ = 200µA
Adjust V_IN for V_GATE low
Adjust V_IN for V_GATE high
Adjust V_IN for V_GATE high
V_IN = 0V
V_IN = 32V
0.1
10
µA
8
20
mA
2
V
4.5
V
5.0
V
–1
µA
1
µA
5
pF
Gate Drive, V_GATE
Zener Clamp,
V_GATE – V_SOURCE
Gate Turn-on Time, t_ON
(Note 4)
Gate Turn-off Time, t_OFF
Threshold Bias Voltage, V₄
Current Sense Trip Voltage,
V_SENSE – V_SOURCE
S1, S2 closed,
V_S = V+, V_IN = 5V
V⁺ = 7V, I₈ = 0
V⁺ = 15V, I₈ = 100 µA
S2 closed, V_IN = 5V
V+ = 15V, V_S = 15V
V⁺ = 32V, V_S = 32V
V_IN switched from 0 to 5V; measure time
for V_GATE to reach 20V
V_IN switched from 5 to 0V; measure time
for V_GATE to reach 1V
I₄ = 200 µA
S2 closed, V_IN = 5V,
V⁺ = 7V,
S4 closed
Increase I₅
I₄ = 100 µA
V⁺ = 15V
V_S = 4.9V
S4 closed
13
15
V
24
27
V
11 12.5 15
V
11
13
16
V
25
50
µs
4
10
µs
1.7
2
2.2
V
75
105 135
mV
70
100 130 mV
5
150 210 270 mV
Peak Current Trip Voltage,
V_SENSE – V_SOURCE
Fault Output Voltage, V₁₄
Current Sense Inhibit, V₁
I₄ = 200 µA
V⁺ = 32V
V_S = 11.8V
V_S = 0V
I₄ = 500 µA
V_S = 25.5V
S3, S4 closed,
V⁺ = 15V, V_IN = 5V
V_IN = 0V, I₁₄ = –100 µA
V_IN = 5V, I₁₄ = 100 µA, current sense tripped
V₁ above which current sense is disabled
Minimum possible V₁
140 200 260 mV
360 520 680 mV
350 500 650 mV
1.6
2.1
V
0.4
1
V
14 14.6
V
7.5
13
V
1
V
Note 1
Note 2
Note 3
Note 4
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Electrical specifications do not apply when
operating the device beyond its specified Operating Ratings.
The MIC5010 is ESD sensitive.
Minimum and maximum Electrical Characteristics are 100% tested at T_A = 25°C and T_A = 85°C, and 100% guaranteed over the entire
range. Typicals are characterized at 25°C and represent the most likely parametric norm.
Test conditions reflect worst case high-side driver performance. Low-side and bootstrapped topologies are significantly faster—see
Applications Information.
April 1998
5-89