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MAX113 Datasheet, PDF (8/12 Pages) Maxim Integrated Products – +3V, 400ksps, 4/8-Channel, 8-Bit ADCs with 1UA Power-Down
+3V, 400ksps, 4/8-Channel,
8-Bit ADCs with 1µA Power-Down
Read Mode (MODE = 0)
In read mode, conversions and data access are con-
trolled by the RD input (Figure 3). The comparator
inputs track the analog input voltage for the duration of
tACQ. A conversion is initiated by driving CS and RD
low. With µPs that can be forced into a wait state, hold
RD low until output data appears. The µP starts the
conversion, waits, and then reads data with a single
read instruction.
In read mode, WR/RDY is configured as a status output
(RDY), so it can drive the ready or wait input of a µP.
RDY is an open-collector output (no internal pull-up)
that goes low after the falling edge of CS and goes high
at the end of the conversion. If not used, the WR/RDY
pin can be left unconnected. The INT output goes low
at the end of the conversion and returns high on the ris-
ing edge of CS or RD.
Write-Read Mode (MODE = 1)
Figures 4 and 5 show the operating sequence for write-
read mode. The comparator inputs track the analog
input voltage for the duration of tACQ. The conversion is
initiated by a falling edge of WR. When WR returns
high, the result of the four-MSBs flash is latched into the
output buffers and the conversion of the four-LSBs flash
starts. INT goes low, indicating conversion end, and the
lower four data bits are latched into the output buffers.
The data is then accessible after RD goes low (see
Timing Characteristics).
A minimum acquisition time (tACQ) is required from INT
going low to the start of another conversion (WR going
low).
Options for reading data from the converter include
using internal delay, reading before delay, and pipelined
operation (discussed in the following sections).
Using Internal Delay
The µP waits for the INT output to go low before reading
the data (Figure 4). INT goes low after the rising edge of
WR, indicating that the conversion is complete and the
result is available in the output latch. With CS low, data
outputs D0–D7 can be accessed by pulling RD low. INT
is then reset by the rising edge of CS or RD.
Fastest Conversion:
Reading Before Delay
An external method of controlling the conversion time is
shown in Figure 5. The internally generated delay
(tINTL) varies slightly with temperature and supply volt-
age, and can be overridden with RD to achieve the
fastest conversion time. RD is brought low after the ris-
ing edge of WR, but before INT goes low. This com-
pletes the conversion and enables the output buffers
PWRDN
tUP
CS
tCSH
RD
tCSS
A0–A2
ADDRESS VALID
(N)
tACQ
tAH
RDY
tRDY
WITH EXTERNAL
PULL-UP
INT
tCRD
D0–D7
tACCO
tACQ
ADDRESS VALID (N + 1)
tAH
tINTH
tDH
VALID DATA
(N)
Figure 3. Read Mode Timing (Mode = 0)
CS
WR
tACQ
A0–A2
RD
INT
D0–D7
tCSS
tWR
tAH
ADDRESS
VALID (N)
tCSH
tACQ
ADDRESS VALID (N + 1)
tCSS
tREAD2
tRD
tCSH
tINTH
tINTL
tACC2
VALID DATA
(N)
tDH
Figure 4. Write-Read Mode Timing (tRD > tINTL) (Mode = 1)
CS
WR
tCSS
A0–A2
tWR
tACQ tAH
ADDRESS
VALID (N)
RD
tCSH
tRD
tINTL
tCSS
INT
tACQ
ADDRESS VALID (N + 1)
tCSH
tREAD1
tRI
D0–D7
tACC1
tCWR
VALID DATA
(N)
tDH
tINTH
Figure 5. Write-Read Mode Timing (tRD < tINTL) (Mode = 1)
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