MAX1567ETL Datasheet, PDF (4/8 Pages) Maxim Integrated Products – PLASTIC ENCAPSULATED DEVICES

V. Quality Assurance Information
A. Quality Assurance Contacts:
Jim Pedicord
Bryan Preeshl
Kenneth Huening
(Manager, Rel Oprations)
(Executive Director of QA)
(Vice President)
B. Outgoing Inspection Level: 0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
C. Observed Outgoing Defect Rate: < 50 ppm
D. Sampling Plan: Mil-Std-105D
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 135°C biased (static) life test are shown in Table 1. Using these results, the Failure
Rate (λ) is calculated as follows:
λ= 1 =
1.83
(Chi square value for MTTF upper limit)
MTTF 192 x 4389 x 48 x 2
Thermal acceleration factor assuming a 0.8eV activation energy
λ = 22.62 x 10^-9
λ= 22.62 F.I.T. (60% confidence level @ 25°C)
This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.
Maxim also performs weekly Burn-In on samples from production to assure the reliability of its processes. The
reliability required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates
to 3 failures in an 80 piece sample. Maxim performs failure analysis on lots exceeding this level. The following
Burn-In Schematic (Spec. #06-6202) shows the static circuit used for this test. Maxim also performs 1000 hour
life test monitors quarterly for each process. This data is published in the Product Reliability Report (RR-1M).
B. Moisture Resistance Tests
Maxim evaluates pressure pot stress from every assembly process during qualification of each new
design. Pressure Pot testing must pass a 20% LTPD for acceptance. Additionally, industry standard
85°C/85%RH or HAST tests are performed quarterly per device/package family.
C. E.S.D. and Latch-Up Testing
The PN07-1 die type has been found to have all pins able to withstand a transient pulse of +/-800V, per
Mil-Std-883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device
withstands a current of ±250mA.