MAX1150 Datasheet, PDF (3/8 Pages) Maxim Integrated Products – 8-Bit, 500Msps Flash ADC

8-Bit, 500Msps Flash ADC
ELECTRICAL CHARACTERISTICS (continued)
(VEE = -5.2V, VRB = -2.00V, VRM = -1.00V, VRT = 0.00V, fCLK = 500MHz, duty cycle = 50%, typical thermal impedance (θJC) = 4°C/W,
Tj = TC = TA = +25°C.) (Note 1)
PARAMETER
CONDITIONS
DYNAMIC PERFORMANCE
Signal-to-Noise Ratio
(without harmonics)
fIN = 50MHz
fIN = 250MHz
Total Harmonic Distortion
fIN = 50MHz
fIN = 250MHz
Signal-to-Noise and
Distortion
fIN = 50MHz
fIN = 250MHz
Spurious-Free Dynamic
Range
DIGITAL INPUTS
fIN = 50MHz
fIN = 250MHz
TEST
MAX1150A
LEVEL MIN TYP MAX
MAX1150B
MIN TYP MAX
UNITS
I
47
45
dB
I
44
42
I
-46
-44
dBc
I
-38
-36
I
43
41
dB
I
37
35
I
49
44
dB
dB
I
41
36
Input High Voltage
(CLK, NCLK)
I
-1.1 -0.7
-1.1 -0.7
V
Input Low Voltage
(CLK, NCLK)
I
-1.8
-1.5
-1.8 -1.5
V
Clock Pulse Width High
(tPWH)
Clock Pulse Width Low
(t_PWL)
I
1.0
0.67
1.0
0.67
ns
I
1.0
0.67
1.0
0.67
ns
Clock Synchronous
Input Currents
V
2
2
µA
DIGITAL OUTPUTS
Logic "1" Voltage
Logic "0" Voltage
I
-1.1 -0.9
-1.1 -0.9
V
I
-1.8
-1.5
-1.8 -1.5
V
POWER-SUPPLY REQUIREMENTS
Supply Voltage (VEE)
Supply Current (IEE)
Power Dissipation
V
2.4
2.4
IV
-4.95 -5.2 -5.45 -4.95 -5.2 -5.45
V
I
1.05
1.2
1.05
1.2
A
I
5.5
6.25
5.5
6.25
W
Note 1: All parameters having min/max specifications are guaranteed. The Test Level column indicates the specific device test actually
performed during production and Quality Assurance inspection. Unless otherwise noted, all tests are pulsed tests; therefore,
T_j = T_C = T_A.
TEST LEVEL TEST PROCEDURE
I
100% production tested at the specified temperature.
II
100% production tested at TA = +25°C, and sample tested at the specified temperatures.
III
QA sample tested only at the specified temperatures.
IV
Parameter is guaranteed (but not tested) by design and characterization data.
V
Parameter is a typical value for information purposes only.
VI
100% production tested at TA = +25°C. Parameter is guaranteed over specified temperature range.
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