MAX1186 Datasheet, PDF (17/21 Pages) Maxim Integrated Products – Dual 10-Bit, 40Msps, 3V, Low-Power ADC with Internal Reference and Multiplexed Parallel Outputs

Dual 10-Bit, 40Msps, 3V, Low-Power ADC with
Internal Reference and Multiplexed Parallel Outputs
25Ω
22pF
0.1µF
V_IN
1 T1 6
N.C. ²
5
2.2µF
3
4
MINICIRCUITS
TT1–6
25Ω
0.1µF
22pF
25Ω
22pF
0.1µF
V_IN
1 T1 6
N.C. ²
5
2.2µF
3
4
MINICIRCUITS
TT1–6
25Ω
0.1µF
22pF
INA+
COM
INA-
MAX1186
INB+
INB-
Figure 6. Transformer-Coupled Input Drive
Static Parameter Definitions
Integral Nonlinearity (INL)
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best straight-line fit or a line drawn
between the endpoints of the transfer function, once
offset and gain errors have been nullified. The static lin-
earity parameters for the MAX1186 are measured using
the best straight-line fit method.
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an
actual step width and the ideal value of 1LSB. A DNL
error specification of less than 1LSB guarantees no
missing codes and a monotonic transfer function.
Dynamic Parameter Definitions
Aperture Jitter
Figure 9 depicts the aperture jitter (t_AJ), which is the
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (t_AD) is the time defined between the
falling edge of the sampling clock and the instant when
an actual sample is taken (Figure 9).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error). The ideal, theoretical
minimum analog-to-digital noise is caused by quantiza-
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