MAX1162_10 Datasheet, PDF (15/18 Pages) Maxim Integrated Products – 16-Bit, +5V, 200ksps ADC with 10μA Shutdown

16-Bit, +5V, 200ksps ADC with 10µA
Shutdown
Table 2. Detailed SSPSTAT Register Contents
CONTROL BIT
SMP
BIT7
CKE
BIT6
D/A
BIT5
P
BIT4
S
BIT3
R/W
BIT2
UA
BIT1
BF
BIT0
X = Don’t care.
MAX1162
SETTINGS
0
1
X
X
X
X
X
X
SYNCHRONOUS SERIAL-PORT CONTROL REGISTER (SSPSTAT)
SPI Data Input Sample Phase. Input data is sampled at the middle of the data output time.
SPI Clock Edge Select Bit. Data is transmitted on the rising edge of the serial clock.
Data Address Bit
Stop Bit
Start Bit
Read/Write Bit Information
Update Address
Buffer Full Status Bit
SCLK
CS
1ST BYTE READ
DOUT*
0
0
0
00
0
0
0
*WHEN CS IS HIGH, DOUT = HIGH-Z
2ND BYTE READ
12
16
D15 D14 D13 D12 D11 D10 D9 D8 D7
MSB
3RD BYTE READ
20
24
TIMING NOT TO SCALE.
D7 D6 D5 D4 D3 D2 D1 D0
LSB
HIGH-Z
Figure 12b. SPI Interface Timing with PIC16/PIC17 in Master Mode (CKE = 1, CKP = 0, SMP = 0, SSPM3 - SSPM0 = 0001)
neously. Three consecutive 8-bit readings (Figure 12b)
are necessary to obtain the entire 16-bit result from the
ADC. DOUT data transitions on the serial clock’s falling
edge and is clocked into the µC on SCLK’s rising edge.
The first 8-bit data stream contains all zeros. The sec-
ond 8-bit data stream contains the MSB through D8.
The third 8-bit data stream contains bits D7 through D0.
Definitions
Integral Nonlinearity
Integral nonlinearity (INL) is the deviation of the values
on an actual transfer function from a straight line. This
straight line can be either a best-fit straight line fit or a
line drawn between the endpoints of the transfer func-
tion, once offset and gain errors have been nulled. The
static linearity parameters for the MAX1162 are mea-
sured using the endpoint method.
Differential Nonlinearity
Differential nonlinearity (DNL) is the difference between
an actual step width and the ideal value of 1LSB. A
DNL error specification of 1LSB guarantees no missing
codes and a monotonic transfer function.
Aperture Definitions
Aperture jitter (t_AJ) is the sample-to-sample variation in
the time between samples. Aperture delay (t_AD) is the
time between the falling edge of the sampling clock
and the instant when the actual sample is taken.
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