CM32Y5V106Z16AT Datasheet, PDF (10/16 Pages) Kyocera Kinseki Corpotation – Multilayer Ceramic Chip Capacitors

Multilayer Ceramic Chip Capacitors
Test Conditions and Standards
Test conditions and Specification for Temperature Compensation type(C^∗ to U^∗ • SL characteristics)
Test Items
Specification (C: nominal capacitance)
Test Conditions
Capacitance Value
Q
Insulation resistance (IR)(∗6)
Within tolerance
C≥30pF: Q≥1000
C<30pF: Q≥400+20C
10,000MΩ or 500MΩ•µF min, whichever is less
Dielectric Resistance (∗6)
No problem observed
Appearance
No problem observed
Termination strength ^(∗2)
No problem observed
Bending strength (∗2)
No mechanical damage at 1mm bent
Vibration
test
Soldering
heat
resistance
Appearance
∆C
Q
Appearance
∆C
Q
IR (∗6)
Withstand voltage
(∗6)
No significant change is detected.
Within tolerance
C≥30pF: Q≥1000
C<30pF: Q≥400+20C
No significant change is detected.
±2.5% or ±0.25pF max, whichever is larger.
C≥30pF: Q≥1000
C<30pF: Q≥400+20C
10,000MΩ or 500MΩ•µF min, whichever is smaller
Resists without problem
Solderability
Ni/Br termination: 90% min
C≤1000pF
C>1000pF
1MHz±10%
1kHz±10%
0.5 to
5Vrms
Measured after the rated voltage is applied for one
minute at normal room temperature and humidity. (∗4)
(∗1) Apply 3 times of the rated voltage for 1 to 5 seconds.
Microscope(10×magnification)
Apply a sideward force of 500g(5N) (∗7) to a PCB-mounted
sample.
Glass epoxy PCB (t=1.6mm); fulcrum
Spacing: 90mm; for 10 seconds.
Vibration frequency: 10 to 55(Hz)
Amplitude: 1.5mm
Sweeping condition: 10→55→10Hz/min
In X, Y and Z directions:
2 hours each Total 6 hours
Soak the sample in 260°C±5°C
solder for 10±0.5seconds
and place in a room at normal temperature
and humidity; measure after 24±2hours.
(Preheating Conditions)
Order
1
2
Temperature
80 to 100°C
150 to 200°C
Time
2minutes
2minutes
Soaking Condition
Sn63 Solder 235±5°C
Sn-3Ag-0.5Cu 245±5°C
2±0.5sec.
3±0.5sec.
Temperature
cycle (∗3)
Humidity
test (∗5)
Appearance
∆C
Q
IR (∗6)
Withstand voltage
(∗6)
Appearance
∆C
Q
IR ^(∗6)
No significant change is detected.
±2.5% or ±0.25pF max, whichever is larger.
C≥30pF: Q≥1000
C<30pF: Q≥400+20C
10,000MΩ or 500MΩ•µF min, whichever is samller
Resists without problem
No significant change is detected.
±7.5% or ±0.75pF max, whichever is larger.
C≥30pF: Q≥200
C<30pF: Q≥100+10C/3
500MΩ or 25MΩ•µF min, whichever is smaller
(Cycle)
Normal room temperature (3min)→
Lowest operation temperature (30min)→
Normal room temperature (3min)→
Highest operation temperature (30min)→
After five cycles (∗3), measure after
24±2hours.
Measure the test sample after storing it
24±2hours at a temperature of 40°C±2°C
and a relative humidity of 90-95% Rh.
for 500+24/−0hours.
High-
temperature
with
loading
Appearance
∆C
Q
No significant change is detected.
±3% or ±0.3pF max, whichever is larger.
C≥30pF: Q≥350
10pF≤C<30pF: Q≥275+5C/2
C<10pF: Q≥200+10C
IR (∗6)
1,000MΩ or 50MΩ•µF min, whichever is smaller
∗1 For the CF series, use 1.5 times when the rated voltage is 250V; use/1.2 times when
the rated voltage exceeds 630V.
∗2 Except CT series
∗3 Different specification for Nickel Barrier termination DN/DR series. (Alumina Substrate)
∗4 Apply 500V for 1minite in case the rated voltage is 1000V or higher.
After applying (∗1) twice of the rated voltage
at a temperature of 125±3°C for
1000+48/−0hours, measure the sample
after storing 24±2hours.
∗5 Except CF series.
∗6 The charge and discharge current of the capacitor must not exceed 50mA.
∗7 2N at 0201 Size