5980-0489E Datasheet, PDF (8/32 Pages) Keysight Technologies – Pulse Pattern and Function

08 | Keysight | Pulse Pattern and Function Arbitrary Generators and Arbitrary Waveform Generator – Brochure
From Pulse to Pattern, Data and PRBS
Pulse pattern generators not only generate single impulses, bursts
or continuous pulse streams as mentioned before.
Their pattern capability also allows the generation of data signals. This versatility is key
to digital device test applications, for example for compliance tests.
In pattern mode, the same full control over the signal output is available as in the
traditional pulse generation mode. This allows the generation of uncounted forms of
data signals, including standard non-return-to-zero (NRZ) signals, or data bursts with
programmable pulse width with additional delay to the clock signal.
Apart from user deined data signals, standardized pseudo random binary sequences
(PRBS) can also be generated.
The ability to create user-defined bit patterns, standard compliant data and
PRBS make the Keysight pulse pattern generators the ideal source for:
– Stimulated eye diagram measurements
– Cross-talk measurements
– Compliance tests
– Jitter tests
– Signal integrity measurements
– Stress tests for receivers
With the 81250A data generator and analyzer platform, modular and parallel pulse and
data applications can be addressed with up to 132 parallel channels. The 81130A’s data
looping capabilities or the 12 MBit deep memory and the PC based pattern manage-
ment tool of the 81133A and 81134A enable you to generate ‘real-life’ data sequences for
today’s latest technology, like serial high-speed busses.
Pulse pattern generators provide all the tools to generate the data packets needed for
digital bus device tests: integrated pattern editors, PC-based graphically enhanced data
and pattern management software, segment looping features as well as hardware-gen-
erated PRBS. This enables engineers to quickly gain detailed insight into their digital bus
device - including devices for:
– USB 2.0
– Serial ATA
– PCI Express^®
– Firewire and more
These tools allow the easy carrying out of all measurements from physical layer charac-
terization, signal integrity, and jitter measurements, to complete standard compliance
test.
1 bit
period
Clock
Width is multiple of clock period.
NRZ
1
0
1
0
1
0
1 Signal can be delayed as required.
DNRZ
RZ
R1
Width and delay can be set as required.
Typical
pulser
modes
Width and delay can be set as required.