U1882B Datasheet, PDF (5/11 Pages) Keysight Technologies – Measurement Application for InfiniiVision

05 | Keysight | U1881A and U1882B Measurement Application for InfiniiVision and Infiniium Oscilloscopes - Data Sheet
Power device analysis
The switching loss in a power supply determines its
efficiency. You can easily characterize instantaneous power loss
and conduction power loss at the switching device over a
designated switching cycle. The dynamic ON resistance
measurement shows you power loss while the power transistor is
conducting.
To determine the reliability of the power supply it is very
important to measure the power loss during dynamic load
changes and to observe the SOA (safe operating area) plot. Using
deep acquisition memory on the scope with the SOA plot, you
can easily identify improper power transistor behavior.
Input line analysis
Power supply designers need to characterize the line power
for power quality, harmonics and conducted emissions under
different operating conditions of the power supply. Some of the
implicit measurements are real power, apparent power, reactive
power, power and crest factor, and graphical display of
harmonics with respect to standards such as IEC 61000-3-2
(Class A, B, C, D) and RTCA DO 160E. By using a current probe
and the power measurement software (equipped with an FFT
math function), you can measure conducted power line
harmonics.
Figure 4. Power device analysis results are displayed both graphically and in
a tabular, "lister" format
Figure 5. Input line analysis results