W8580BP Datasheet, PDF (4/11 Pages) Keysight Technologies – WaferPro Express Software

04 | Keysight | WaferPro Express Software - Brochure
Product Overview
In order to efficiently setup and manage wafer-level automated measurements, WaferPro
Express provides the following components in a convenient and easy to use user inter-
face. Figure 1 shows the WaferPro Express main window.
–– Interface to instruments and prober systems that are connected to the controlling
PC via GPIB bus. WaferPro supports several types and brands of GPIB, LAN to GPIB,
USB to GPIB interfaces on both Windows and LINUX systems. See Table 6 for list of
supported interfaces.
–– Turnkey built-in drivers for a variety of Keysight and non-Keysight instruments,
including the Keysight B1500A, Keysight PNA and PNA-X Series, most Keysight C-V
meters and impedance analyzers. Also, WaferPro Express supports an impressive
list of Keysight, Agilent and Hewlett-Packard legacy instruments. Instruments and
prober settings are all managed in a single convenient window. For details, please
see Table 5.
–– A complete wafer map environment that is completely independent from the prober
control software. This dedicated wafer map environment allows WaferPro-XP proj-
ects to run on different test benches with little or no modifications. Figure 4 shows
the wafer mapping definition in WaferPro-XP.
–– The maximum efficiency is obtained in conjunction with Cascade Microtech Ve-
lox prober control software. A dedicated interface link allows WaferPro advanced
control of Velox and enables key features such as full wafer map synchronization
to seamlessly import and export wafer map and subdies table to and from Velox,
temperature control as well as dynamic RF Calibration. The latter allows WaferPro
Express to monitor the validity of the RF calibration during long measurements and
is achieved by controlling Cascade WinCal XE calibration software.
–– A test plan sequencer allows users to create a test plan to measure devices located
in wafers and dies at different temperatures. Devices to be tested in each die are
listed in convenient table format with each row showing the device name, polarity
and pad connections, as well as the test routine to be applied. The sequencer con-
trols temperature, wafer and chuck positioning every step of the way, making fully
automated measurements possible.
–– An extensive library of example DC, CV and RF routines tests for the most common
device technologies, CMOS and BJT. New tests can be easily created directly from
the user interface.
–– A powerful programming environment that supports two languages, the Python lan-
guage and the IC-CAP Programming Extraction Language (PEL), for users who want
to deploy programs that were developed in the IC-CAP platform. WaferPro Express
users can write programs that execute custom measurements, check results, flag
measurement success/failure and post-process raw measured data before informa-
tion is saved to file.
–– Powerful data display capabilities. Sweep data can be displayed on a variety of
plots, using various color and line formats. In addition, wafer map plots can show the
distribution of spot data on the wafer. See Figure 5 for examples of graphics.