E6567E Datasheet, PDF (2/4 Pages) Keysight Technologies – cdma2000/1xEV-DO/LTE/LTE-A Wireless Test Manager

02 | Keysight | E6567F cdma2000/1xEV-DO/LTE/LTE-A Wireless Test Manager - Technical Overview
Reduce wireless devices test cost for manufacturing and acceler-
ate production by using powerful, easy-to-use test automation
software
Tests Supported
LTE/LTE-A transmitter tests
–– Minimum output power
–– Maximum output power
–– Aggregate power control tolerance
–– EVM equalizer spectrum flatness
–– Occupied bandwidth
–– Additional maximum power reduction
–– Configured UE transmitted output power
–– Spectrum emission mask
–– Additional spectrum emission mask
–– PRACH time mask
–– SRS time mask
–– Power control absolute power tolerance
–– PUSCH-EVM with exclusion period
–– In-band emissions for non-allocated RB
–– Maximum power reduction
–– Frequency error
–– Error vector magnitude
–– Carrier leakage
–– Adjacent channel leakage power ratio
–– General ON/OFF time mask
LTE/LTE-A receiver tests
–– Reference sensitivity level
–– Maximum input level
–– Adjacent channel selectivity (ACS)
–– In-band blocking
–– Reference sensitivity level for CA
–– Maximum input level for CA
–– LTE tiered Rx sensitivity search
–– LTE tiered Rx sensitivity search at UE
CDMA call processing
–– MEID supported (Yes/No)
–– Public long code mask type (ESN based,
–– BS assigned, MEID based)
–– Registration
–– Page (base station origination)
–– MS (mobile station) origination
–– Base station release
–– Voice quality analog quick audio
–– functionality
–– Talk time
–– IMT-2000, Japan CDMA, NMT-450,
–– Korean PCS, US PCS, AWS, US cellular, Upper 700 MHz,
400 MHz European PAMR, and 800 MHz PAMR bands
–– Hard handoff (system, band, channel, and PN offset)
–– CDMA AMPS interband handoff
CDMA transmitter tests
–– Waveform quality
–– Code domain power
–– Traffic channel open loop power control
–– Closed loop power control
–– Time response of open loop power control
–– Maximum RF output power
–– Minimum controlled output power
–– Access probe open loop power
–– Gated power
–– Code channel timing and phase error
–– Transmitter spurious emissions
–– Handoff waveform quality
–– Code channel power accuracy
–– Spurious emission
CDMA receiver tests
–– Traffic channel FER with AWGN
–– Supplemental channel FER with AWGN
–– Receiver sensitivity FER
–– Receiver sensitivity level search
CDMA Rx/Tx tests
–– Quick general test
AMPS transmitter tests
–– Frequency error
–– RF power output
–– Audio frequency response
–– Audio distortion
–– FM hum and noise
–– SAT deviation and frequency error
–– Compressor response
–– Analog DTMF
–– Analog signaling tone
AMPS receiver tests
–– SINAD
–– Audio frequency response
–– Audio distortion
–– Hum and noise
–– Expandor response
1xEV-DO calling processing
(Applies to Release 0, A, and B)
–– Open/end session
–– Open data connection
–– IMT-2000, Japan CDMA, NMT 450, Korean PCS, US PCS,
AWS, US cellular, Upper 700 MHz, 400 MHz European PAMR,
and 800 MHz PAMR bands
–– Handoff (interband and channel)
–– CDMA AMPS interband handoff