DE150-101N09A Datasheet, PDF (1/5 Pages) List of Unclassifed Manufacturers – RF Power MOSFET

DE150-101N09A
RF Power MOSFET
N-Channel Enhancement Mode
Low Q_g and R_g
High dv/dt
Nanosecond Switching
Ideal for Class C, D, & E Applications
Symbol
V_DSS
V_DGR
Test Conditions
T_J = 25°C to 150°C
T_J = 25°C to 150°C; R_GS = 1 MΩ
Maximum Ratings
100
V
100
V
V_DSS = 100 V
I_D25
= 9.0 A
R_DS(on) ≤ _{0.16 Ω}
P_DC
= 200 W
V_GS
V_GSM
Continuous
Transient
±20
V
±30
V
I_D25
T_c = 25°C
I_DM
T_c = 25°C, pulse width limited by T_JM
9.0
A
54
A
I_AR
T_c = 25°C
14
A
E_AR
T_c = 25°C
7.5 mJ
dv/dt
P_DC
P_DHS
I_S ≤ I_DM, di/dt ≤ 100A/µs, V_DD ≤ V_DSS,
T_j ≤ 150°C, R_G = 0.2Ω
I_S = 0
T_c = 25°C
Derate 4.4W/°C above 25°C
5.5 V/ns
>200 V/ns
200
W _GATE
80 W
DRAIN
P_DAMB
R_thJC
R_thJHS
T_c = 25°C
3.5 W
0.74 C/W
1.50 C/W
Symbol Test Conditions
Characteristic Values
T_J = 25°C unless otherwise specified
min. typ. max.
V_DSS
V_GS(th)
I_GSS
I_DSS
V_GS = 0 V, I_D = 3 ma
V_DS = V_GS, I_D = 4 ma
V_GS = ±20 V_DC, V_DS = 0
V_DS = 0.8 V_DSS T_J = 25°C
V_GS = 0
T_J = 125°C
100
V
2
2.8
V
±100 nA
25 µA
250 _µA
R_DS(on)
V_GS = 15 V, I_D = 0.5I_D25
Pulse test, t ≤ 300µS, duty cycle d ≤ 2%
0.16
Ω
g_fs
V_DS = 15 V, I_D = 0.5I_D25, pulse test
2.5
3.0
S
T_J
-55
+175 °C
T_JM
175
°C
T_stg
-55
+175 °C
SG1 SG2
SD1 SD2
Features
• Isolated Substrate
− high isolation voltage (>2500V)
− excellent thermal transfer
− Increased temperature and power
cycling capability
• IXYS advanced low Q_g process
• Low gate charge and capacitances
− easier to drive
− faster switching
• Low R_DS(on)
• Very low insertion inductance (<2nH)
• No beryllium oxide (BeO) or other
hazardous materials
Advantages
• Optimized for RF and high speed
switching at frequencies to >100MHz
• Easy to mount—no insulators needed
• High power density
T_L
1.6mm(0.063 in) from case for 10 s
300
°C
Weight
2
g