 English |
|
|
|
|
|
|
|
| IS62WV102416EALL Datasheet, PDF (13/15 Pages) Integrated Silicon Solution, Inc – TTL compatible interface levels | |||
| |||
| ◁ |
IS62/65WV102416EALL
IS62/65WV102416EBLL
DATA RETENTION CHARACTERISTICS
Symbol Parameter
Test Condition
OPTION
VDR
VDD for Data See Data Retention Waveform IS62(5)WV102416EALL
Retention
IS62(5)WV102416EBLL
IDR
Data Retention VDD= VDR(min),
Com.
Current
(1) 0V ⤠CS2 ⤠0.2V, or
(2)
⥠VDD â 0.2V,
Ind.
CS2 ⥠VDD - 0.2V
Auto
(3) and ⥠VDD -0.2V,
⤠0.2V, CS2 ⥠VDD - 0.2V
tSDR
Data Retention See Data Retention Waveform
Setup Time
tRDR
Recovery Time See Data Retention Waveform
Note:
1. If >VDDâ0.2V, all other inputs including CS2 and and must meet this condition.
2. Typical values are measured at VDD=VDR(min), TA = 25â and not 100% tested.
Min.
1.5
1.5
-
-
-
0
tRC
Typ.(2)
-
-
-
-
-
Max.
-
-
50
65
165
-
-
Unit
V
V
uA
ns
ns
DATA RETENTION WAVEFORM ( CONTROLLED)
tSDR
DATA RETENTION MODE
tRDR
VDD
VDR
GND
> VDD-0.2V
DATA RETENTION WAVEFORM (CS2 CONTROLLED)
VDD
CS2
VDR
GND
DATA RETENTION MODE
tSDR
tRDR
CS2 < 0.2V
Integrated Silicon Solution, Inc.- www.issi.com
13
Rev. A
12/12/2014
|
▷ |
German
Russian
Spanish
Italian
Polish
Chinese
Japanese
Korean
French
Portuguese