D2800D_15 Datasheet, PDF (6/10 Pages) International Rectifier – HIGH RELIABILITY, RADIATION TOLERANT, LOW POWER, DC-DC CONVERTER

D28XXD-SERIES
(28V Input, Regulated Dual Outputs)
Device Screening
Test / Inspection
Method
/EM Suffix Flight (No Suffix)
Element Evaluation
MIL-STD-38534 Class K equivalent with SEM
X
Nondestructive Bond Pull
MIL-STD-883, Method 2023
X
Internal Visual
MIL-STD-883, Method 2017
X
Temperature Cycling
MIL-STD-883, Method 1010
Condition C
Constant Acceleration
MIL-STD-883, Method 2001 (3Kg)
A, Y1 Axis only
Electrical
In accordance with device specificaton
X
PIND
MIL-STD-883, Method 2020
A
Burn-in (2 x 160 hours)
MIL-STD-883, Method 1015
48 Hours
320 Hours
Final Electrical (Group A) In accordance with device specification
X
X
Seal
MIL-STD-883, Method 1014
Condition A
Fine Leak
A1
Gross Leak
C
Radiographic
MIL-STD-883, Method 2012
N/A
External Visual
MIL-STD-883, Method 2009
X
X
Radiation Performance Characteristics
Test
Conditions
Min
Unit
Total Ionizing Dose (Gamma)
Single Event Effects
SEU, SEL, SEGR, SEB
MIL-STD-883, Method 1019.5
Operating bias applied during exposure,
Half Rated Load, VIN = 28V
Heavy Ions (LET)
Operating bias applied during exposure,
Full Rated Load, VIN = 18, 28, 50V
50
KRads (Si)
40
MeV•cm² / mg
* Test performed at TAMU
International Rectifier currently does not have a DLA certified Radiation Hardness Assurance Program.
6
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