HA5340 Datasheet, PDF (9/12 Pages) Intersil Corporation – High Speed, Low Distortion, Precision Monolithic Sample and Hold Amplifier

HA5340
DESIGN INFORMATION (Continued)
The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica-
tion and design information only. No guarantee is implied.
Test Circuits
HOLD STEP ERROR AND DROOP RATE
S/H
CONTROL
INPUT
1
-INPUT
2
+INPUT
7
OUTPUT
V_O
8
N.C.
14
S/H CONTROL
11
N.C.
HA-5340
(C_H = 135pF = INTERNAL)
HOLD STEP ERROR
1. Observe the ‘‘hold step’’ voltage V_p:
S/H CONTROL
VO
V_p
HOLD (4.0V)
SAMPLE (0V)
DROOP RATE TEST
1. Observe the voltage ‘‘droop’’, ∆V_O/∆T:
S/H CONTROL
HOLD (4.0V)
SAMPLE (0V)
V_O
∆V_O
∆T
2. Measure the slope of the output during hold, ∆V_O /∆T.
3. Droop can be positive or negative - usually to one rail or the other
not to GND.
V_IN
20V_p-p
200kHz
SINE WAVE
S/H CONTROL
INPUT
HOLD MODE FEED THROUGH ATTENUATION
ANALOG
MUX OR
SWITCH
A_IN
+V
-V
HA-5340
9
5
1
-IN
2
+IN
14 S/H
CONTROL
SUPPLY
GND
13
C_H
11
7
OUT
REF
COM
6
TO
SUPPLY
COMMON
N.C.
TO
SIGNAL
GND
V_OUT
Feedthrough in dB = 20 Log V_OUT where:
V_IN
V_OUT = Voltsp-p, Hold Mode,
V_IN = Voltsp-p.
7-16
Spec Number 511117-883