HA5340 Datasheet, PDF (4/12 Pages) Intersil Corporation – High Speed, Low Distortion, Precision Monolithic Sample and Hold Amplifier

Specifications HA5340/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
SYMBOL
CONDITIONS
NOTES TEMPERATURE MIN MAX UNITS
Hold Mode Feedthrough
V_HMF
V_IN = 20V_P-P, 200kHz
1
Sample Mode Noise
E_{n (SAMPLE)}
DC to 10MHz, V_S/H = 0V,
1
Voltage
R_LOAD = 2K
Hold Mode Noise
Voltage
E_{n (HOLD)}
DC to 10MHz, V_S/H = 5V,
1
R_LOAD = 2K
Input Capacitance
C_IN
V_S/H = 0V
1
Input Resistance
R_IN
V_S/H = 0V, Delta V_IN = 20V
1
0.1% Acquisition Time
T_ACQ 0.1%
C_L = 60pF, R_L = 2K, V_OUT = 0V
1
to 10V Step
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
-
-70
dB
-
335 µV_RMS
-
100 µV_RMS
-
5
pF
1
-
MΩ
-
600
ns
Total Harmonic
Distortion Hold Mode
THD_200K(HOLD)
F_S = 450kHz,
V_IN = 20V_P-P, 200kHz
THD_500K(HOLD)
F_S = 450kHz,
V_IN = 5V_P-P, 500kHz
Total Harmonic
Distortion Sample Mode
THD_200K(SAMPLE) V_IN = 20V_P-P, 200kHz
THD_500K(SAMPLE) V_IN = 5V_P-P, 500kHz
1
+25^oC
-
-50 dBc
1
+25^oC
-
-47 dBc
1
+25^oC
-
-60 dBc
1
+25^oC
-
-49 dBc
NOTE:
1. The parameters listed in this table are controlled via design or process parameters and are not directly tested. These parameters are
characterized upon initial design release and upon design changes which would affect these characteristics.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (SEE TABLES 1 AND 2)
Interim Electrical Parameters (Pre Burn-In)
-
Final Electrical Test Parameters
1(Note 1), 2, 3, 4, 5, 6
Group A Test Requirements
1, 2, 3, 4, 5, 6
Groups C and D Endpoints
1
NOTE:
1. PDA applies to Subgroup 1 only. No other subgroups are included in PDA.
CAUTION: These devices are sensitive to electronic discharge. Proper IC handling procedures should be followed.
7-11
Spec Number 511117-883