HA-5320883 Datasheet, PDF (9/11 Pages) Intersil Corporation – High Speed Precision Sample and Hold Amplifier

HA-5320/883
DESIGN INFORMATION (Continued)
The information contained in this section has been developed through characterization by Intersil Semiconductor and is for use as applica-
tion and design information only. No guarantee is implied.
Test Circuits
CHARGE TRANSFER AND DRIFT CURRENT
S/H
CONTROL
INPUT
1
- INPUT
2
+ INPUT
7
OUTPUT
V_O
8
N.C.
14
S/H CONTROL
11
N.C.
HA-5320
(C_H = 100pF)
CHARGE TRANSFER TEST
1. Observe the “hold step” voltage V_p:
S/H CONTROL
VO
HOLD (+3.5V)
SAMPLE (0V)
V_p
2. Compute charge transfer: Q = V_pC_H
DRIFT CURRENT TEST
1. Observe the voltage “droop”, ∆V_O/∆T:
S/H CONTROL
HOLD (4.0V)
SAMPLE (0V)
V_O
∆V_O
∆T
2. Measure the slope of the output during hold, ∆V_O /∆T, and com-
pute drift current: I_D = C_H ∆V_O/∆T.
V_IN
10V_p-p
100kHz
SINE WAVE
S/H CONTROL
INPUT
HOLD MODE FEED THROUGH ATTENUATION
ANALOG
MUX OR
SWITCH
A_IN
+V
-V
HA-5320
9
1
- IN
2
+ IN
14
S/H CONTROL
SUPPLY
GND ^CEXT
13
11
5
REF
COM
6
7
OUT
INT.
COMP.
8
TO
SUPPLY
COMMON
N.C.
TO
SIGNAL
GND
N.C.
Feedthrough in dB = 20 Log
V_OUT = Volts_p-p, Hold Mode,
V_IN = Volts_p-p.
V_OUT where:
V_IN
V_OUT
Spec Number 511096-883
9