HA-5320883 Datasheet, PDF (4/11 Pages) Intersil Corporation – High Speed Precision Sample and Hold Amplifier

HA-5320/883
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
LIMITS
PARAMETER
SYMBOL
CONDITIONS
NOTES TEMPERATURE MIN MAX UNITS
Hold Mode Feedthrough
V_HMF
V_IN = 10V_P-P, 100kHz
1
Hold Step Error
V_ERROR V_IH = 3.5V, V_IL = 0V,
1
T_RISE (V_IL to V_IH) = 10ns
Sample Mode Noise
E_N(SAM- DC to 10MHz, V_S/H = 0V,
1
Voltage
PLE)
R_LOAD = 2kΩ
Hold Mode Noise
E_N(HOLD) DC to 10MHz, V_S/H = 5V,
1
Voltage
R_LOAD = 2kΩ
Input Capacitance
C_IN
V_S/H = 0V
1
Input Resistance
R_IN
V_S/H = 0V, Delta V_IN = 20V
1
Slew Rate
+SR
C_L = 50pF, R_L = 2kΩ,
1
V_OUT = -5V to +5V Step
10%, 90% pts
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
+25^oC
-
3
mV
-11
11
mV
-
200 µV_RMS
-
200 µV_RMS
-
5
pF
1
-
MΩ
30
-
V/µs
-SR
C_L = 50pF, R_L = 2kΩ,
1
+25^oC
30
-
V/µs
V_OUT = +5V to -5V Step
10%, 90% pts
Rise and Fall Times
T_R
C_L = 50pF, R_L = 2kΩ,
1
V_OUT = 0V to +200mV Step
10%, 90% pts
+25^oC
-
150
ns
T_F
C_L = 50pF, R_L = 2kΩ,
1
V_OUT = 0V to -200mV Step
10%, 90% pts
+25^oC
-
150
ns
Overshoot
+OS
C_L = 50pF, R_L = 2kΩ,
1
V_OUT = 0V to +200mV Step
-OS
C_L = 50pF, R_L = 2kΩ,
1
V_OUT = 0V to -200mV Step
0.1% Acquisition Time T_ACQ 0.1% C_L = 50pF, R_L = 2kΩ,
1
V_OUT = 0V to 10V Step
+25^oC
+25^oC
+25^oC
-
25
%
-
25
%
-
1.2
µs
NOTE:
1. The parameters listed in this table are controlled via design or process parameters and are not directly tested. These parameters are
characterized upon initial design release and upon design changes which would affect these characteristics.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (SEE TABLE 1)
Interim Electrical Parameters (Pre Burn-In)
-
Final Electrical Test Parameters
1(Note 1), 2, 3
Group A Test Requirements
1, 2, 3
Groups C and D Endpoints
1
NOTE:
1. PDA applies to Subgroup 1 only. No other subgroups are included in PDA.
Spec Number 511096-883
4