ISL62881C Datasheet, PDF (8/37 Pages) Intersil Corporation – Single-Phase PWM Regulator for IMVP-6.5™ Mobile CPUs and GPUs

ISL62881C, ISL62881D
Electrical Specifications
Operating Conditions: V_DD = 5V, T_A = -40°C to +100°C, f_SW = 300kHz, unless otherwise
noted. Boldface limits apply over the operating temperature range, -40°C to
+100°C. (Continued)
PARAMETER
SYMBOL
TEST CONDITIONS
MIN
MAX
(Note 7) TYP (Note 7) UNITS
BOOTSTRAP DIODE
Forward Voltage
Reverse Leakage
PROTECTION
V_F
PVCC = 5V, I_F = 2mA
I_R
V_R = 25V
0.58
V
0.2
µA
Overvoltage Threshold
Severe Overvoltage
Threshold
OV_H
OV_HS
VSEN rising above setpoint for >1ms
VSEN rising for >2µs
150 200 240
mV
1.525 1.55 1.575
V
OC Threshold Offset
Undervoltage Threshold
LOGIC THRESHOLDS
ISUM- pin current, R_COMP open circuit
28
30
32
µA
UV_f
VSEN falling below setpoint for >1.2ms
-355 -295 -235
mV
VR_ON Input Low
VR_ON Input High
VID0-VID6 and DPRSLPVR
Input Low
V_IL(1.0V)
V_IH(1.0V)
V_IH(1.0V)
V_IL(1.0V)
ISL62881CHRTZ
ISL62881CIRTZ
0.7
0.75
0.3
V
V
V
0.3
V
VID0-VID6 and DPRSLPVR
Input High
V_IH(1.0V)
0.7
V
THERMAL MONITOR (ISL62881D)
NTC Source Current
NTC = 1.3V
53
60
67
µA
Over-Temperature
Threshold
V (NTC) falling
1.18 1.2 1.22
V
VR_TT# Low Output
Resistance
R_TT
I = 20mA
6.5
9
Ω
CLK_EN# OUTPUT LEVELS
CLK_EN# Low Output
Voltage
V_OL
I = 4mA
0.26 0.4
V
CLK_EN# Leakage Current
CURRENT MONITOR
I_OH
CLK_EN# = 3.3V
-1
1
µA
IMON Output Current
I_IMON
ISUM- pin current = 20µA
ISUM- pin current = 10µA
108 120 132
µA
54
60
66
ISUM- pin current = 5µA
25.5 30 34.5
IMON Clamp Voltage
Current Sinking Capability
V_IMONCLAMP
1.1 1.15
V
275
µA
INPUTS
VR_ON Leakage Current
I_{VR_ON}
VR_ON = 0V
VR_ON = 1V
-1
0
µA
0
1
µA
VIDx Leakage Current
I_VIDx
VIDx = 0V
VIDx = 1V
-1
0
µA
0.45
1
µA
DPRSLPVR Leakage Current
I_DPRSLPVR
DPRSLPVR = 0V
DPRSLPVR = 1V
-1
0
µA
0.45
1
µA
SLEW RATE
Slew Rate (For VID Change)
SR
5
6.5 mV/µs
NOTES:
6. Limits established by characterization and are not production tested.
7. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established
by characterization and are not production tested.
8
FN7596.0
March 8, 2010