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ISL54217_14 Datasheet, PDF (8/24 Pages) Intersil Corporation – USB 2.0 High-Speed x 2 Channels/Stereo Audio Dual SP3T (Dual 3-to-1 Multiplexer)
ISL54217
Test Circuits and Waveforms (Continued)
VDD C
VC0
LOGIC
INPUT
VC1
VOUT
SWITCH
OUTPUT
0V
2D- OR 2D+
VINPUT
1D- OR 1D+
L OR R
C0, C1
COMx
VOUT
RL
CL
50Ω
10pF
90%
LOGIC
INPUT
tD
GND
FIGURE 2A. MEASUREMENT POINTS
Repeat test for all switches. CL includes fixture and stray
capacitance.
FIGURE 2B. TEST CIRCUIT
FIGURE 2. BREAK-BEFORE-MAKE TIME
VDD
C
VDD
C
rON = V1/60mA
COMx
VL OR R
C0
V1
C1
60mA
L OR R
GND
VCOH
VC1H
rON = V1/40mA
VD- OR D+
D- OR D+
40mA
V1
COMx
GND
C0 VC0L AND
C1 VC1H OR
VC0H AND
VC1L
Repeat test for all switches.
FIGURE 3. AUDIO rON TEST CIRCUIT
VDD
C
CTRL
AUDIO OR USB
IMPEDANCE
ANALYZER
VCx
COMx
GND
VCxL OR
VCxH
Repeat test for all switches.
FIGURE 5. CAPACITANCE TEST CIRCUIT
8
Repeat test for all switches.
FIGURE 4. USB rON TEST CIRCUIT
VDD
C
SIGNAL
GENERATOR
CTRL
L OR R
COMx
32Ω
VCx
0V OR FLOAT
COMx
R or L
ANALYZER
NC
GND
32Ω
FIGURE 6. AUDIO CROSSTALK TEST CIRCUIT
FN6817.4
June 17, 2010