HCTS299MS Datasheet, PDF (8/13 Pages) Intersil Corporation – Radiation Hardened 8-Bit Universal Shift Register; Three-State

HCTS299MS
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
NOTE: 1. Except FN test which will be performed 100% Go/No-Go.
READ AND RECORD
PRE RAD
POST RAD
1, 9
Table 4 (Note 1)
TABLE 8. STATIC BURN-IN AND DYNAMIC
OPEN
GROUND
1/2 VCC = 3V ± 0.5V
VCC = 6V ± 0.5V
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
8, 17
1 - 7, 9 - 16, 18, 19
-
20
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
8, 17
10
-
1 - 7, 9, 11 - 16, 18 - 20
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
2, 3, 10, 18, 19
4 - 8, 13 - 17
1, 9, 20
NOTES:
1. Each pin except VCC and GND will have a resistor of 10kΩ ± 5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 680Ω ± 5% for dynamic burn-in
OSCILLATOR
50kHz
25kHz
-
-
-
-
12
11
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
8, 17
10
1 - 7, 9, 11 - 16, 18 - 20
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number 518640
631