English
Language : 

ISL54217_09 Datasheet, PDF (7/21 Pages) Intersil Corporation – USB 2.0 High-Speed x 2Channels/Stereo Audio Dual SP3T (Dual 3-to-1 Multiplexer)
ISL54217
Test Circuits and Waveforms
VC0,C1
LOGIC
INPUT
VC0,C1
50%
tOFF
tr < 20ns
tf < 20ns
SWITCH
INPUT
VINPUT
SWITCH
OUTPUT 0V
VOUT
90%
tON
90%
Logic input waveform is inverted for switches that have the opposite
logic sense.
VDD
C
VINPUT
SWITCH
INPUT
C0,C1
COMx
LOGIC
INPUT
GND
VOUT
RL
CL
50Ω 10pF
Repeat test for all switches. CL includes fixture and stray
capacitance.
VOUT
=
V (INPUT)
---------R-----L---------
RL + rON
FIGURE 1A. ADDRESS tTRANS MEASUREMENT POINTS
FIGURE 1B. ADDRESS tTRANS TEST CIRCUIT
FIGURE 1. SWITCHING TIMES
VDD C
VC0
LOGIC
INPUT
VC1
VOUT
SWITCH
OUTPUT
0V
2D- OR 2D+
VINPUT
1D- OR 1D+
L OR R
C0, C1
COMx
VOUT
RL
CL
50Ω
10pF
90%
LOGIC
INPUT
tD
GND
FIGURE 2A. MEASUREMENT POINTS
Repeat test for all switches. CL includes fixture and stray
capacitance.
FIGURE 2B. TEST CIRCUIT
FIGURE 2. BREAK-BEFORE-MAKE TIME
VDD
C
VDD
C
rON = V1/60mA
COMx
VL OR R
C0
V1
C1
60mA
L OR R
GND
VCOH
VC1H
rON = V1/40mA
VD- OR D+
D- OR D+
40mA
V1
COMx
GND
C0 VC0L AND
C1 VC1H OR
VC0H AND
VC1L
Repeat test for all switches.
FIGURE 3. AUDIO rON TEST CIRCUIT
Repeat test for all switches.
FIGURE 4. USB rON TEST CIRCUIT
7
FN6817.3
May 4, 2009