ISL54216 Datasheet, PDF (7/17 Pages) Intersil Corporation – USB 2.0 High-Speed/UART Dual SP3T (Dual 3 to 1 Multiplexer)

ISL54216
Test Circuits and Waveforms (Continued)
V_DD
C
SIGNAL
GENERATOR
CTRL
xD-
COMx
50Ω
V_Cx
0V OR FLOAT
ANALYZER
50Ω
COMx
xD+
GND
N.C.
FIGURE 5. CROSSTALK TEST CIRCUIT
V_{DD C}
t_ri
DIN+
DIN-
OUT+
OUT-
90%
10% ^50%
t_{skew_i}
90%
50%
10%
t_fi
t_ro
90%
10%
90%
50%
t_{skew_o}
50%
t_f0
10%
0V
V_DD
DIN+
15.8Ω
143Ω
DIN-
15.8Ω
143Ω
C0 ^VDD
C1
COM+
COM-
D+
OUT+
C_L
45Ω
D-
OUT-
C_L
45Ω
GND
|tro - tri| Delay Due to Switch for Rising Input and Rising Output Signals.
|tfo - tfi| Delay Due to Switch for Falling Input and Falling Output Signals.
|tskew_0| Change in Skew through the Switch for Output Signals.
|tskew_i| Change in Skew through the Switch for Input Signals.
FIGURE 6A. MEASUREMENT POINTS
FIGURE 6B. TEST CIRCUIT
FIGURE 6. SKEW TEST
7
FN7701.0
September 27, 2010