ISL54216 Datasheet, PDF (6/17 Pages) Intersil Corporation – USB 2.0 High-Speed/UART Dual SP3T (Dual 3 to 1 Multiplexer)

ISL54216
Test Circuits and Waveforms
V_C0,C1
LOGIC
INPUT
V_C0,C1
50%
t_OFF
t_r < 20ns
t_f < 20ns
SWITCH
INPUT
V_INPUT
SWITCH
OUTPUT _0V
V_OUT
90%
t_ON
90%
Logic input waveform is inverted for switches that have the
opposite logic sense.
V_DD
C
V_INPUT
SWITCH
INPUT
C0, C1
LOGIC
INPUT
GND
COMx
V_OUT
R_L
C_L
50Ω
10pF
Repeat test for all switches. C_L includes fixture and stray
capacitance.
V_OUT
=
V _(INPUT)
---------^R-----^L---------
R_L + r_ON
FIGURE 1A. ADDRESS t_TRANS MEASUREMENT POINTS
FIGURE 1B. ADDRESS t_TRANS TEST CIRCUIT
FIGURE 1. SWITCHING TIMES
V_{DD C}
V_C0
LOGIC
INPUT
V_C1
V_INPUT
3D- OR 3D+
2D- OR 2D+
1D- OR 1D+
C0, C1
COMx
V_OUT
R_L
C_L
50Ω
10pF
V_OUT
SWITCH
OUTPUT
0V
90%
LOGIC
INPUT
GND
t_D
Repeat test for all switches. C_L includes fixture and stray
capacitance.
FIGURE 2A. MEASUREMENT POINTS
FIGURE 2B. TEST CIRCUIT
FIGURE 2. BREAK-BEFORE-MAKE TIME
V_DD
C
r_ON = V₁/17mA
xD- OR xD+
V_{D- OR} V_D+
C0
V₁
C1
17mA
COMx
GND
0V
V_DD
Repeat test for all switches.
FIGURE 3. r_ON TEST CIRCUIT
V_DD
C
CTRL
xD- OR xD+
IMPEDANCE
ANALYZER
V_Cx
COMx
GND
V_CxL OR
V_CxH
Repeat test for all switches.
FIGURE 4. CAPACITANCE TEST CIRCUIT
6
FN7701.0
September 27, 2010