ISL54200_07 Datasheet, PDF (7/16 Pages) Intersil Corporation – USB 2.0 High/Full Speed Multiplexer

ISL54200
Test Circuits and Waveforms (Continued)
V_DD
C
V_DD
C
EN
HSx or FSx
SIGNAL
GENERATOR
EN
HSx
COMx
45Ω
IMPEDANCE
ANALYZER
COMx
GND
IN
VIN_L OR
VIN_H
Repeat test for all switches.
FIGURE 5. CAPACITANCE TEST CIRCUIT
IN
VIN
ANALYZER
COMx
FSx
NC
GND
R_L
Signal direction through switch is reversed, worst case values
are recorded. Repeat test for all switches.
FIGURE 6. CROSSTALK TEST CIRCUIT
DIN+
DIN-
OUT+
OUT-
t_ri
10%
90%
50%
t_{skew_i}
90%
50%
10%
t_fi
t_ro
90%
10%
90%
50%
t_{skew_o}
50%
t_f0
10%
FIGURE 7A. MEASUREMENT POINTS
V_{DD C}
VIN
DIN+
DIN-
15.8Ω
143Ω
15.8Ω
143Ω
EN
VIN
COMD2
COMD1
D2
OUT+
C_L
45Ω
D1
OUT-
C_L
45Ω
GND
|tro-tri| Delay Due to Switch for Rising Input and Rising Output
Signals.
|tfo-tfi| Delay Due to Switch for Falling Input and Falling Output
Signals.
|tskew_0| Change in Skew through the Switch for Output Signals.
|tskew_i| Change in Skew through the Switch for Input Signals.
FIGURE 7B. TEST CIRCUIT
FIGURE 7. SKEW TEST
7
FN6408.1
July 11, 2007