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ISL54226_10 Datasheet, PDF (6/18 Pages) Intersil Corporation – High-Speed USB 2.0 (480Mbps) DPST Switch with Overvoltage Protection (OVP) and Dedicated Charger Port Detection
ISL54226
Electrical Specifications - 2.7V to 5.25V Supply Test Conditions: VDD = +3.3V, GND = 0V, VOE/ALMH = 1.4V,
VOE/ALML = 0.5V, (Note 10), Unless Otherwise Specified. Boldface limits apply over the operating temperature range,
-40°C to +85°C. (Continued)
PARAMETER
TEST CONDITIONS
TEMP
MIN
MAX
(°C) (Notes 11, 12) TYP (Notes 11, 12) UNITS
Positive Supply Current, IDD VDD = 3.6V, OE/ALM = 1.4V
25
-
25
32
µA
Full
-
-
38
µA
DIGITAL INPUT CHARACTERISTICS
Input Voltage Low, VOE/ALML VDD = 2.7V to 3.6V
Full
-
-
0.5
V
Input Voltage High, VOE/ALMH VDD = 2.7V to 3.6V
Full
1.4
-
-
V
Input Voltage Low, VOE/ALML VDD = 3.7V to 4.2V
Full
-
-
0.7
V
Input Voltage High, VOE/ALMH VDD = 3.7V to 4.2
Full
1.7
-
-
V
Input Voltage Low, VOE/ALML VDD = 4.3V to 5.25V
Full
-
-
0.8
V
Input Voltage High, VOE/ALMH VDD = 4.3V to 5.25V
Full
2.0
-
-
V
Input Current, IOE/ALML
VDD = 5.25V, OE/ALM = 0V
Full
-
-8.2
-
nA
Input Current, IOE/ALMH
VDD = 5.25V, OE/ALM = 5.25V, 4MΩ Full
-
1.4
-
µA
Pull-down
NOTES:
10. VLOGIC = Input voltage to perform proper function.
11. The algebraic convention, whereby the most negative value is a minimum and the most positive a maximum, is used in this
data sheet.
12. Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified. Temperature limits established
by characterization and are not production tested.
13. Flatness is defined as the difference between maximum and minimum value of ON-resistance over the specified analog signal
range.
14. rON matching between channels is calculated by subtracting the channel with the highest max rON value from the channel
with lowest max rON value.
15. Limits established by characterization and are not production tested.
Test Circuits and Waveforms
VDD
LOGIC
INPUT
0V
50%
tOFF
tr < 20ns
tf < 20ns
SWITCH
INPUT
VINPUT
SWITCH
OUTPUT 0V
VOUT
90%
tON
90%
Logic input waveform is inverted for switches that have the
opposite logic sense.
VDD
C
VINPUT
SWITCH
INPUT
COMx
OE/ALM
VIN
GND
Dx
VOUT
RL
CL
50Ω 50pF
Repeat test for all switches. CL includes fixture and stray
capacitance.
VOUT
=
V (INPUT)
---------R-----L---------
RL + rON
FIGURE 1A. MEASUREMENT POINTS
FIGURE 1B. TEST CIRCUIT
FIGURE 1. SWITCHING TIMES
6
FN7614.0
July 29, 2010