ISL3178AE Datasheet, PDF (6/14 Pages) Intersil Corporation – ±15kV ESD Protected, 3.3V, Full Fail-Safe, Low Power, High Speed or Slew Rate Limited, RS-485/RS-422 Transceivers

ISL3178AE
Electrical Specifications
Test Conditions: V_CC = 3.0V to 3.6V; Unless Otherwise Specified. Typicals are at V_CC = 3.3V, T_A = +25°C,
(Note 2). Parameters with MIN and/or MAX limits are 100% tested at +25°C, unless otherwise specified.
Temperature limits established by characterization and are not production tested.
PARAMETER
SYMBOL
TEST CONDITIONS
TEMP
(°C)
MIN
TYP MAX UNITS
Receiver Enable from Shutdown to t_ZH(SHDN) R_L = 1kΩ, C_L = 15pF, SW = GND (Figure 6), Full
-
240
500
ns
Output High
(Notes 7, 9)
Receiver Enable from Shutdown to t_ZL(SHDN) R_L = 1kΩ, C_L = 15pF, SW = V_CC (Figure 6), Full
-
240
500
ns
Output Low
(Notes 7, 9)
NOTES:
2. All currents into device pins are positive; all currents out of device pins are negative. All voltages are referenced to device ground unless
otherwise specified.
3. Supply current specification is valid for loaded drivers when DE = 0V.
4. Applies to peak current. See “Typical Performance Curves” starting on page 10 for more information.
5. When testing devices with the shutdown feature, keep RE = 0 to prevent the device from entering SHDN.
6. When testing devices with the shutdown feature, the RE signal high time must be short enough (typically <100ns) to prevent the device from
entering SHDN.
7. Versions with a shutdown feature are put into shutdown by bringing RE high and DE low. If the inputs are in this state for less than 50ns, the parts
are guaranteed not to enter shutdown. If the inputs are in this state for at least 600ns, the parts are guaranteed to have entered shutdown. See
“Low Power Shutdown Mode” on page 10.
8. Keep RE = VCC, and set the DE signal low time >600ns to ensure that the device enters SHDN.
9. Set the RE signal high time >600ns to ensure that the device enters SHDN.
10. Δt_SKEW is the magnitude of the difference in propagation delays of the specified terminals of two units tested with identical test conditions (V_CC,
temperature, etc.).
11. V_CC ≥ 3.15V
12. Limits established by characterization and are not production tested.
13. If the Tx or Rx enable function isn’t needed, connect the enable pin to the appropriate supply (see “Pin Descriptions” on page 2) through a 1kΩ
to 3kΩ resistor.
14. For wafer sale the switching test limits are established by characterization.
Test Circuits and Waveforms
V_CC ^DE
DI
Z
D
Y
V_OD
R_L/2
R_L/2 VOC
V_CC ^DE
DI
Z
D
Y
V_OD
375Ω
R_L = 60Ω
V_CM
-7V TO +12V
375Ω
FIGURE 1A. V_OD AND V_OC
FIGURE 1B. V_OD WITH COMMON MODE LOAD
FIGURE 1. DC DRIVER TEST CIRCUITS
6
FN6887.1
May 6, 2009