HCTS164MS Datasheet, PDF (6/9 Pages) Intersil Corporation – Radiation Hardened 8-Bit Serial-In/Parallel-Out Register

Specifications HCS164MS1
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
READ AND RECORD
PRE RAD
POST RAD
1, 9
Table 4 (Note 1)
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OSCILLATOR
OPEN
GROUND
1/2 VCC = 3V ± 0.5V VCC = 6V ± 0.5V
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
3 - 6, 10 - 13
1, 2, 7 - 9
-
14
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
3 - 6, 10 - 13
7
-
1, 2, 8, 9, 14
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
7
3 - 6, 10 - 13
9, 14
8
1, 2
NOTES:
1. Each pin except VCC and GND will have a resistor of 10KΩ ± 5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 1KΩ ± 5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
3 - 6, 10 - 13
7
1, 2, 8, 9, 14
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number 518756
235