HCS374MS_04 Datasheet, PDF (6/10 Pages) Intersil Corporation – Radiation Hardened Octal D-Type Flip-Flop, Three-State, Positive Edge Triggered

Specifications HCS374MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
Initial Test (Preburn-In)
Interim Test I (Postburn-In)
Interim Test II (Postburn-In)
PDA
Interim Test III (Postburn-In)
PDA
Final Test
Group A (Note 1)
Group B
Subgroup B-5
METHOD
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
100%/5004
Sample/5005
Sample/5005
GROUP A SUBGROUPS
1, 7, 9
1, 7, 9
1, 7, 9
1, 7, 9, Deltas
1, 7, 9
1, 7, 9, Deltas
2, 3, 8A, 8B, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTES:
1. Alternate Group A testing in accordance with Method 5005 of MIL-STD-883 may be exercised.
2. Table 5 parameters only.
READ AND RECORD
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
Subgroups 1, 2, 3, 9, 10, 11,
(Notes)
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
PRE RAD
Group E Subgroup 2
5005
1, 7, 9
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TEST
POST RAD
Table 4
READ AND RECORD
PRE RAD
POST RAD
1, 9
Table 4 (Note 1)
TABLE 8. STATIC BURN-IN AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V ± 0.5V
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
2, 5, 6, 9, 12, 1, 3, 4, 7, 8, 10, 11, 13,
-
15, 16, 19
14, 17, 18
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
2, 5, 6, 9, 12,
10
-
15, 16, 19
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
1, 10
2, 5, 6, 9, 12, 15, 16, 19
VCC = 6V ± 0.5V
20
1, 3, 4, 7, 8, 11, 13,
14, 17, 18, 20
20
NOTES:
1. Each pin except VCC and GND will have a resistor of 1KΩ ± 5% for dynamic burn-in.
2. Each pin except VCC and GND will have a resistor of 680Ω ± 5% for dynamic burn-in.
OSCILLATOR
50kHz
25kHz
-
-
-
-
11
3, 4, 7, 8, 13,
14, 17, 18
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
2, 5, 6, 9, 12, 15, 16, 19
10
1, 3, 4, 7, 8, 11, 13, 14, 17, 18, 20
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number 518770
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