HCS240MS Datasheet, PDF (6/10 Pages) Intersil Corporation – Radiation Hardened Octal Buffer/Line Driver, Three-State

Specifications HCS240MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
Initial Test (Preburn-In)
100%/5004
1, 7, 9
Interim Test I (Postburn-In)
100%/5004
1, 7, 9
Interim Test II (Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Interim Test III (Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005 1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.
READ AND RECORD
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
ICC, IOL/H, IOZL/H
Subgroups 1, 2, 3, 9, 10, 11
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
PRE RAD
Group E Subgroup 2
5005
1, 7, 9
NOTE:
1. Except FN test which will be performed 100% go/no-go.
TEST
POST RAD
Table 4
READ AND RECORD
PRE RAD
POST RAD
1, 9
Table 4 (Note 1)
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
STATIC I BURN-IN (Note 1)
3, 5, 7, 9, 12, 14, 16, 18
1, 2, 4, 6, 8, 10, 11,
13, 15, 17, 19
STATIC II BURN-IN (Note 1)
3, 5, 7, 9, 12, 14, 16, 18
10
1/2 VCC = 3V ± 0.5V
-
-
DYNAMIC BURN-IN (Note 2)
-
1, 10, 19
3, 5, 7, 9, 12, 14, 16,
18
NOTES:
1. Each pin except VCC and GND will have a series resistor of 10kΩ ± 5%.
2. Each pin except VCC and GND will have a series resistor of 680Ω ± 5%.
VCC = 6V ± 0.5V
20
1, 2, 4, 6, 8, 11, 13,
15, 17, 19, 20
20
OSCILLATOR
50kHz
25kHz
-
-
-
-
2, 4, 6, 8, 11,
-
13, 15, 17
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V ± 0.5V
3, 5, 7, 9, 12, 14, 16, 18
10
1, 2, 4, 6, 8, 11, 13, 15, 17, 19, 20
NOTE: Each pin except VCC and GND will have a resistor of 47KΩ ± 5% for irradiation testing. Group E,
Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number 518837
6