CD4073BMS Datasheet, PDF (6/10 Pages) Intersil Corporation – CMOS AND Gate

Specifications CD4073BMS, CD4081BMS, CD4082BMS
TABLE 6. APPLICABLE SUBGROUPS (Continued)
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
CONFORMANCE GROUPS
Group E Subgroup 2
TABLE 7. TOTAL DOSE IRRADIATION
MIL-STD-883
METHOD
TEST
PRE-IRRAD
POST-IRRAD
5005
1, 7, 9
Table 4
READ AND RECORD
PRE-IRRAD
POST-IRRAD
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
OSCILLATOR
FUNCTION
OPEN
PART NUMBER CD4073BMS
GROUND
VDD
9V ± -0.5V
50kHz
25kHz
Static Burn-In 1
6, 9, 10
1 - 5, 7, 8, 11 - 13
14
Note 1
Static Burn-In 2
Note 1
6, 9, 10
7
1 - 5, 8, 11 - 14
Dynamic Burn-
-
In Note 1
7
14
6, 9, 10
1, 5, 8, 11 - 13
Irradiation
Note 2
6, 9, 10
7
1 - 5, 8, 11 - 14
PART NUMBER CD4081BMS
Static Burn-In 1
3, 4, 10, 11
1, 2, 5 - 9, 12, 13
14
Note 1
Static Burn-In 2
Note 1
3, 4, 10, 11
7
1, 2, 5, 6, 8, 9,
12 - 14
Dynamic Burn-
-
In Note 1
7
14
3, 4, 10, 11 1, 2, 5, 6, 8, 9, 12,
13
Irradiation
Note 2
3, 4, 10, 11
7
1, 2, 5, 6, 8, 9,
12 - 14
PART NUMBER CD4082BMS
Static Burn-In 1
1, 6, 8, 13
2 - 5, 7, 9 - 12
14
Note 1
Static Burn-In 2
Note 1
1, 6, 8, 13
7
2 - 5, 9 - 12, 14
Dynamic Burn-
6, 8
7
In Note 1
14
1, 3
2 - 5, 9 - 12
Irradiation
Note 2
1, 6, 8, 13
7
2 - 5, 9 - 12, 14
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K ± 5%, VDD = 18V ± 0.5V
2. Each pin except VDD and GND will have a series resistor of 47K ± 5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures, VDD
= 10V ± 0.5V
7-438