CD4049UBMS_07 Datasheet, PDF (6/11 Pages) Intersil Corporation – CMOS Hex Buffer/Converter

CD4049UBMS
Post Irradiation Electrical Performance Characteristics
PARAMETER
SYMBOL
CONDITIONS
NOTES
Supply Current
N Threshold Voltage
N Threshold Voltage
Delta
I_DD
V_NTH
ΔV_TND
V_DD = 20V, V_IN = V_DD or GND
V_DD = 10V, I_SS = -10μA
V_DD = 10V, I_SS = -10μA
9, 12
9, 12
9, 12
P Threshold Voltage
P Threshold Voltage
Delta
V_TP
ΔV_TPD
V_SS = 0V, I_DD = 10μA
V_SS = 0V, I_DD = 10μA
9, 12
9, 12
Functional
F
VDD = 18V, VIN = VDD or GND
9
VDD = 3V, VIN = VDD or GND
Propagation Delay
Time
t_PHL
t_PLH
V_DD = 5V
NOTES:
9. All voltages referenced to device GND.
10. C_L = 50pF, R_L = 200k, Input t_R, t_F < 20ns.
11. See Table 2 for +25°C limit.
12. Read and Record
9, 10, 11, 12
TEMP (°C)
+25
+25
+25
+25
+25
+25
+25
LIMITS
MIN
MAX
-
7.5
-2.8
-0.2
-
±1
UNITS
μA
V
V
0.2
2.8
V
-
±1
V
VOH > VDD/2 VOL < VDD/2 V
-
1.35 x +25
ns
Limit
TABLE 1. BURN-IN AND LIFE TEST DELTA PARAMETERS +25°C
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-1
Output Current (Sink)
Output Current (Source)
I_DD
I_OL5
I_OH5A
± 0.2μA
± 20% x Pre-Test Reading
± 20% x Pre-Test Reading
TABLE 2. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 13)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
PDA (Note 13)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
NOTES:
13. 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
READ AND RECORD
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
IDD, IOL5, IOH5A
Subgroups 1, 2, 3, 9, 10, 11
Subgroups 1, 2 3
6
FN3315.1
March 6, 2007