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ICL3221EM_14 Datasheet, PDF (5/12 Pages) Intersil Corporation – ±15kV ESD Protected, +3V, 1μA, 250kbps, RS-232 Transmitters/Receivers
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ISL3221EM
Electrical Specifications
Test Conditions: VCC = 3.3V ±10%, C1 - C4 = 0.1µF; Unless Otherwise Specified.
Typicals are at TA = +25°C. Boldface limits apply over the operating temperature
range, -55°C to +125°C. (Continued)
PARAMETER
TEST CONDITIONS
TEMP MIN
(°C) (Note 6)
TYP
MAX
(Note 6) UNITS
Receiver Positive or Negative
Threshold to INVALID Low
Delay (tINVL)
RECEIVER INPUT
25
-
30
-
µs
Input Voltage Range
25
-25
-
25
V
Input Threshold Low
Input Threshold High
Input Hysteresis
VCC = 3.3V
VCC = 3.3V
25
0.6
1.2
-
V
25
-
1.5
2.4
V
25
-
0.5
-
V
Input Resistance
25
3
5
7
kΩ
TRANSMITTER OUTPUT
Output Voltage Swing
All Transmitter Outputs Loaded with 3kΩ to Ground Full
±5.0
±5.4
-
V
Output Resistance
VCC = V+ = V- = 0V, Transmitter Output = ±2V Full
Output Short-Circuit Current
Full
300
-
10M
±35
-
Ω
±60
mA
Output Leakage Current
VOUT = ±12V, VCC = 0V or 3V to 3.6V,
Full
-
Automatic Power-down or FORCEOFF = SHDN = GND
-
±25
µA
TIMING CHARACTERISTICS
Maximum Data Rate
RL = 3kΩ, CL = 1000pF, One Transmitter Switching Full
Receiver Propagation Delay Receiver Input to
tPHL
25
Receiver Output,
CL = 150pF
tPLH
25
Receiver Output Enable Time Normal Operation
25
250
-
-
-
500
0.15
0.15
200
-
kbps
-
µs
-
µs
-
ns
Receiver Output Disable Time Normal Operation
25
-
200
-
ns
Transmitter Skew
tPHL to tPLH (Note 5)
25
-
Receiver Skew
tPHL to tPLH
25
-
Transition Region Slew Rate VCC = 3.3V,
CL = 150pF to 2500pF
25
4
RL = 3kΩ to 7kΩ,
Measured from 3V to
CL = 150pF to 1000pF
25
6
-3V or -3V to 3V
100
1000
ns
50
1000
ns
-
30
V/µs
-
30
V/µs
ESD PERFORMANCE
RS-232 Pins (TOUT, RIN)
Human Body Model
25
-
±15
-
kV
IEC61000-4-2 Contact Discharge
25
-
±8
-
kV
IEC61000-4-2 Air Gap Discharge
25
-
±15
-
kV
All Other Pins
Human Body Model
25
-
±2
-
kV
NOTES:
5. Transmitter skew is measured at the transmitter zero crossing points.
6. Parts are 100% tested at +25°C. Full temp limits are guaranteed by bench and tester characterization
5
FN7552.0
December 17, 2009
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