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HCTS393MS Datasheet, PDF (5/9 Pages) Intersil Corporation – Radiation Hardened Dual 4-Stage Binary Counter
Specifications HCTS393MS
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
Quiescent Current
Output Current (Sink)
Output Current
(Source)
Output Voltage Low
Output Voltage High
Input Leakage Current
Noise Immunity
Functional Test
CPn to Q0
CPn to Q1
CPn to Q2
CPn to Q3
MR to Qn
SYMBOL
(NOTES 1, 2)
CONDITIONS
ICC
VCC = 5.5V, VIN = VCC or GND
IOL
VCC = 4.5V, VIN = VCC or GND,
VOUT = 0.4V
IOH
VCC = 4.5V, VIN = VCC or GND,
VOUT = VCC -0.4V
VOL
VCC = 4.5V and 5.5V,
VIH = VCC/2, VIL = 0.8V, IOL = 50µA
VOH
VCC = 4.5V and 5.5V,
VIH = VCC/2, VIL = 0.8V, IOH = -50µA
IIN
VCC = 5.5V, VIN = VCC or GND
FN
VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V, (Note 3)
TPHL
TPLH
VCC = 4.5V
TPHL
TPLH
VCC = 4.5V
TPHL
TPLH
VCC = 4.5V
TPHL
TPLH
VCC = 4.5V
TPHL VCC = 4.5V
TEMPERATURE
+25oC
+25oC
200K RAD
LIMITS
MIN MAX UNITS
-
0.75
mA
4.0
-
mA
+25oC
-4.0
-
mA
+25oC
-
0.1
V
+25oC
+25oC
+25oC
VCC
-
V
-0.1
-
±5
µA
-
-
-
+25oC
2
34
ns
+25oC
2
43
ns
+25oC
2
52
ns
+25oC
2
59
ns
+25oC
2
34
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500Ω, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests VO ≥ 4.0V is recognized as a logic “1”, and VO ≤ 0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25oC)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12µA
IOL/IOH
5
-15% of 0 Hour
Spec Number 518633
676